{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,8]],"date-time":"2026-10-08T23:55:44Z","timestamp":1791503744496,"version":"4.3.4"},"reference-count":32,"publisher":"IOP Publishing","issue":"8","license":[{"start":{"date-parts":[[2026,4,24]],"date-time":"2026-04-24T00:00:00Z","timestamp":1776988800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2026,4,24]],"date-time":"2026-04-24T00:00:00Z","timestamp":1776988800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/iopscience.iop.org\/info\/page\/text-and-data-mining"}],"funder":[{"name":"Berry College Office of Undergraduate Research"}],"content-domain":{"domain":["iopscience.iop.org"],"crossmark-restriction":false},"short-container-title":["Mater. Res. Express"],"published-print":{"date-parts":[[2026,4,28]]},"abstract":"Abstract<\/jats:title>\n \n Despite various applications in the fields of optoelectronics, energy-conversion, and infrared detection, documented studies of magnetron sputtering of indium films are scarce when compared to indium-based semiconductors. In this study, indium films were deposited at various voltage\/current combinations to investigate the effects of deposition power on resulting film characteristics. Crystallographic, morphological, and electrical characterizations of deposited films were performed using x-ray diffraction, scanning electron microscopy, and four-point probe measurements. Results showed general increases in average crystallite size (31.1\u201341.0\u2009nm) and decreasing resistivity (\n \n \n \n <\/jats:tex-math>\n \n \n \n \u223c<\/mml:mo>\n <\/mml:mrow>\n \n 10<\/mml:mn>\n \n \u2212<\/mml:mo>\n 3<\/mml:mn>\n <\/mml:mrow>\n <\/mml:msup>\n <\/mml:mrow>\n <\/mml:math>\n <\/jats:inline-formula>\n \u201310\n \u22124<\/jats:sup>\n \u2009\n \n \n \n <\/jats:tex-math>\n \n \n \u03a9<\/mml:mi>\n \n \u22c5<\/mml:mo>\n <\/mml:mrow>\n \n cm<\/mml:mi>\n <\/mml:mrow>\n <\/mml:mrow>\n <\/mml:math>\n <\/jats:inline-formula>\n ) as deposition power was increased from\n \n \n \n <\/jats:tex-math>\n \n \n \n \u223c<\/mml:mo>\n <\/mml:mrow>\n 70<\/mml:mn>\n <\/mml:mrow>\n <\/mml:math>\n <\/jats:inline-formula>\n \u2013110\u2009W. Texture coefficient analysis demonstrated that increasing sputtering power enhanced the preferred (101) crystallite orientation. These results demonstrate a simple approach to fabricating indium thin films via DC magnetron sputtering without external substrate heating or post-deposition annealing.\n <\/jats:p>","DOI":"10.1088\/2053-1591\/ae5d94","type":"journal-article","created":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T22:53:50Z","timestamp":1775775230000},"page":"086401","update-policy":"https:\/\/doi.org\/10.1088\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Effects of deposition power on DC magnetron sputtering of indium thin films"],"prefix":"10.1088","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-5964-7789","authenticated-orcid":true,"given":"M T R","family":"Pierce","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3034-6777","authenticated-orcid":true,"given":"Z R","family":"Lindsey","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"266","published-online":{"date-parts":[[2026,4,24]]},"reference":[{"key":"mrxae5d94bib1","first-page":"456","type":"conference-proceedings","article-title":"High density indium bumping through pulse plating used for pixel x-ray detectors","author":"Tian","year":"2009"},{"key":"mrxae5d94bib2","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2022.153501","type":"journal-article","article-title":"Thermally grown indium (In) thin-film for creating ohmic contact and In-bumps for HgCdTe-based IR detectors","volume":"596","author":"Meena","year":"2022","journal-title":"Appl. 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Published by IOP Publishing Ltd","name":"copyright_information","label":"Copyright Information"},{"value":"2025-12-28","name":"date_received","label":"Date Received","group":{"name":"publication_dates","label":"Publication dates"}},{"value":"2026-04-09","name":"date_accepted","label":"Date Accepted","group":{"name":"publication_dates","label":"Publication dates"}},{"value":"2026-04-24","name":"date_epub","label":"Online publication date","group":{"name":"publication_dates","label":"Publication dates"}}]}}