{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T09:15:43Z","timestamp":1740129343389,"version":"3.37.3"},"reference-count":33,"publisher":"IOP Publishing","issue":"21","license":[{"start":{"date-parts":[[2012,5,9]],"date-time":"2012-05-09T00:00:00Z","timestamp":1336521600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/iopscience.iop.org\/page\/copyright"},{"start":{"date-parts":[[2012,5,9]],"date-time":"2012-05-09T00:00:00Z","timestamp":1336521600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/iopscience.iop.org\/info\/page\/text-and-data-mining"}],"content-domain":{"domain":["iopscience.iop.org"],"crossmark-restriction":false},"short-container-title":["J. Phys. D: Appl. Phys."],"published-print":{"date-parts":[[2012,5,30]]},"abstract":"<jats:title>Abstract<\/jats:title>\n               <jats:p>The structural properties of Pb(Zr<jats:sub>0.50<\/jats:sub>Ti<jats:sub>0.50<\/jats:sub>)O<jats:sub>3<\/jats:sub> thin films with no preferential orientation were studied throughout the film thickness. An analysis on depth profile shows the existence of a significant (1\u20090\u20090) alignment near the film\u2013electrode interface. Nanoscale piezoelectric measurements demonstrate the existence of a self-polarization effect in the studied films. An increase in this effect with film thickness increasing from 200 to 710\u00a0nm suggests that Schottky barriers and\/or mechanical coupling near the film\u2013electrode interface cannot be the main mechanisms responsible for the self-polarization effect in the studied films.<\/jats:p>","DOI":"10.1088\/0022-3727\/45\/21\/215304","type":"journal-article","created":{"date-parts":[[2012,5,9]],"date-time":"2012-05-09T11:14:01Z","timestamp":1336562041000},"page":"215304","update-policy":"https:\/\/doi.org\/10.1088\/crossmark-policy","source":"Crossref","is-referenced-by-count":10,"title":["Structural depth profile and nanoscale piezoelectric properties of randomly oriented Pb(Zr<sub>0.50<\/sub>Ti<sub>0.50<\/sub>)O<sub>3<\/sub> thin films"],"prefix":"10.1088","volume":"45","author":[{"given":"E C","family":"Lima","sequence":"first","affiliation":[]},{"given":"E B","family":"Ara\u00fajo","sequence":"additional","affiliation":[]},{"given":"A G","family":"Souza Filho","sequence":"additional","affiliation":[]},{"given":"A R","family":"Paschoal","sequence":"additional","affiliation":[]},{"given":"I K","family":"Bdikin","sequence":"additional","affiliation":[]},{"given":"A L","family":"Kholkin","sequence":"additional","affiliation":[]}],"member":"266","published-online":{"date-parts":[[2012,5,9]]},"reference":[{"key":"jphysd419713bib01","doi-asserted-by":"publisher","first-page":"275","DOI":"10.1016\/j.sna.2003.11.022","volume":"111","author":"Akasheh","year":"2004","journal-title":"Sensors Actuators A"},{"key":"jphysd419713bib02","doi-asserted-by":"publisher","first-page":"1800","DOI":"10.1063\/1.97701","volume":"50","author":"Kushida","year":"1987","journal-title":"Appl. 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