{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T22:38:31Z","timestamp":1773787111912,"version":"3.50.1"},"reference-count":29,"publisher":"IOP Publishing","issue":"42","license":[{"start":{"date-parts":[[2012,10,4]],"date-time":"2012-10-04T00:00:00Z","timestamp":1349308800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/iopscience.iop.org\/page\/copyright"},{"start":{"date-parts":[[2012,10,4]],"date-time":"2012-10-04T00:00:00Z","timestamp":1349308800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/iopscience.iop.org\/info\/page\/text-and-data-mining"}],"content-domain":{"domain":["iopscience.iop.org"],"crossmark-restriction":false},"short-container-title":["J. Phys. D: Appl. Phys."],"published-print":{"date-parts":[[2012,10,24]]},"abstract":"<jats:title>Abstract<\/jats:title>\n               <jats:p>Reactive magnetron sputtering was used to deposit Y<jats:sub>\n                     <jats:italic>x<\/jats:italic>\n                  <\/jats:sub>Al<jats:sub>1\u2212<jats:italic>x<\/jats:italic>\n                  <\/jats:sub>N thin films, 0\u00a0\u2a7d\u00a0<jats:italic>x<\/jats:italic>\u00a0\u2a7d\u00a00.22, onto Al<jats:sub>2<\/jats:sub>O<jats:sub>3<\/jats:sub>(0\u20090\u20090\u20091) and Si(1\u20090\u20090) substrates. X-ray diffraction and analytical electron microscopy show that the films are solid solutions. Lattice constants increase with Y concentration, in agreement with <jats:italic>ab initio<\/jats:italic> calculations. Spectroscopic ellipsometry measurements reveal a band gap decrease from 6.2\u00a0eV (<jats:italic>x<\/jats:italic>\u00a0=\u00a00) down to 4.5\u00a0eV (<jats:italic>x<\/jats:italic>\u00a0=\u00a00.22). Theoretical investigations within the special quasirandom structure approach show that the wurtzite structure has the lowest mixing enthalpy for 0\u00a0\u2a7d\u00a0<jats:italic>x<\/jats:italic>\u00a0\u2a7d\u00a00.75.<\/jats:p>","DOI":"10.1088\/0022-3727\/45\/42\/422001","type":"journal-article","created":{"date-parts":[[2012,10,4]],"date-time":"2012-10-04T16:21:28Z","timestamp":1349367688000},"page":"422001","update-policy":"https:\/\/doi.org\/10.1088\/crossmark-policy","source":"Crossref","is-referenced-by-count":53,"title":["Y<sub>x<\/sub>Al<sub>1\u2212x<\/sub>N thin films"],"prefix":"10.1088","volume":"45","author":[{"given":"Agn\u0117","family":"\u017dukauskait\u0117","sequence":"first","affiliation":[]},{"given":"Christopher","family":"Tholander","sequence":"additional","affiliation":[]},{"given":"Justinas","family":"Palisaitis","sequence":"additional","affiliation":[]},{"given":"Per O \u00c5","family":"Persson","sequence":"additional","affiliation":[]},{"given":"Vanya","family":"Darakchieva","sequence":"additional","affiliation":[]},{"given":"Nebiha Ben","family":"Sedrine","sequence":"additional","affiliation":[]},{"given":"Ferenc","family":"Tasn\u00e1di","sequence":"additional","affiliation":[]},{"given":"Bj\u00f6rn","family":"Alling","sequence":"additional","affiliation":[]},{"given":"Jens","family":"Birch","sequence":"additional","affiliation":[]},{"given":"Lars","family":"Hultman","sequence":"additional","affiliation":[]}],"member":"266","published-online":{"date-parts":[[2012,10,4]]},"reference":[{"key":"jphysd443650bib01","doi-asserted-by":"publisher","first-page":"345","DOI":"10.1016\/0022-5088(85)90066-9","article-title":"The ternary systems ScAlN and YAlN","volume":"109","author":"Schuster","year":"1985","journal-title":"J. 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