{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,19]],"date-time":"2025-09-19T07:15:16Z","timestamp":1758266116717},"reference-count":52,"publisher":"IOP Publishing","issue":"6","license":[{"start":{"date-parts":[[2016,5,19]],"date-time":"2016-05-19T00:00:00Z","timestamp":1463616000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/iopscience.iop.org\/info\/page\/text-and-data-mining"},{"start":{"date-parts":[[2016,5,19]],"date-time":"2016-05-19T00:00:00Z","timestamp":1463616000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/iopscience.iop.org\/page\/copyright"}],"content-domain":{"domain":["iopscience.iop.org"],"crossmark-restriction":true},"short-container-title":["Semicond. Sci. Technol."],"published-print":{"date-parts":[[2016,6,1]]},"DOI":"10.1088\/0268-1242\/31\/6\/064002","type":"journal-article","created":{"date-parts":[[2016,5,19]],"date-time":"2016-05-19T22:39:07Z","timestamp":1463697547000},"page":"064002","update-policy":"http:\/\/dx.doi.org\/10.1088\/crossmark-policy","source":"Crossref","is-referenced-by-count":6,"title":["Composition measurement of epitaxial Sc<sub><i>x<\/i><\/sub>Ga<sub>1\u2212<i>x<\/i><\/sub>N films"],"prefix":"10.1088","volume":"31","author":[{"given":"H C L","family":"Tsui","sequence":"first","affiliation":[]},{"given":"L E","family":"Goff","sequence":"additional","affiliation":[]},{"given":"N P","family":"Barradas","sequence":"additional","affiliation":[]},{"given":"E","family":"Alves","sequence":"additional","affiliation":[]},{"given":"S","family":"Pereira","sequence":"additional","affiliation":[]},{"given":"R G","family":"Palgrave","sequence":"additional","affiliation":[]},{"given":"R J","family":"Davies","sequence":"additional","affiliation":[]},{"given":"H E","family":"Beere","sequence":"additional","affiliation":[]},{"given":"I","family":"Farrer","sequence":"additional","affiliation":[]},{"given":"D A","family":"Ritchie","sequence":"additional","affiliation":[]},{"given":"M A","family":"Moram","sequence":"additional","affiliation":[]}],"member":"266","published-online":{"date-parts":[[2016,5,19]]},"reference":[{"key":"1","doi-asserted-by":"publisher","DOI":"10.1063\/1.358463"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2007.293"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1002\/1521-3951(200202)229:3&lt;R1::AID-PSSB99991&gt;3.0.CO;2-O"},{"key":"4","doi-asserted-by":"crossref","DOI":"10.1088\/0268-1242\/26\/1\/014036","volume":"26","author":"Kneissl M","year":"2011","journal-title":"Semicond. Sci. Technol.","ISSN":"http:\/\/id.crossref.org\/issn\/0268-1242","issn-type":"print"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1039\/c3ta14189f"},{"key":"6","doi-asserted-by":"crossref","DOI":"10.1088\/0953-8984\/26\/22\/225801","volume":"26","author":"Knoll S M","year":"2014","journal-title":"J. Phys.: Condens. Matter","ISSN":"http:\/\/id.crossref.org\/issn\/0953-8984","issn-type":"print"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1002\/pssa.201100158"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1063\/1.4868538"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1557\/PROC-799-Z9.5"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.70.193309"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1063\/1.2140889"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4795784"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1063\/1.4861034"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1063\/1.4824179"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1063\/1.4848036"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1063\/1.3268466"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1002\/pssa.201532292"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1063\/1.4916679"},{"key":"19","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200802611"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1063\/1.4788728"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1063\/1.3489939"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1063\/1.4714220"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1063\/1.3448235"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1063\/1.4800231"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1063\/1.3665945"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1016\/j.tsf.2008.05.050"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcrysgro.2008.01.045"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcrysgro.2008.11.084"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1063\/1.1318227"},{"key":"30","doi-asserted-by":"publisher","DOI":"10.1116\/1.581360"},{"key":"31","doi-asserted-by":"publisher","DOI":"10.1063\/1.2794009"},{"key":"32","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcrysgro.2007.09.009"},{"key":"33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcrysgro.2009.03.029"},{"key":"34","doi-asserted-by":"publisher","DOI":"10.1063\/1.1370548"},{"key":"35","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.66.201203"},{"key":"36","volume":"27","author":"Caro M A","year":"2015","journal-title":"J. Phys.: Condens. Matter","ISSN":"http:\/\/id.crossref.org\/issn\/0953-8984","issn-type":"print"},{"key":"37","doi-asserted-by":"publisher","DOI":"10.1063\/1.119949"},{"key":"38","doi-asserted-by":"crossref","first-page":"6977","DOI":"10.1088\/0953-8984\/13\/32\/307","volume":"13","author":"O\u2019Donnell K P","year":"2001","journal-title":"J. Phys.: Condens. Matter","ISSN":"http:\/\/id.crossref.org\/issn\/0953-8984","issn-type":"print"},{"key":"39","doi-asserted-by":"crossref","DOI":"10.1088\/0034-4885\/72\/3\/036502","volume":"72","author":"Moram M A","year":"2009","journal-title":"Rep. Prog. Phys.","ISSN":"http:\/\/id.crossref.org\/issn\/0034-4885","issn-type":"print"},{"key":"40","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1096-9918(199704)25:4&lt;254::AID-SIA232&gt;3.0.CO;2-F"},{"key":"41","doi-asserted-by":"publisher","DOI":"10.1021\/ac300904c"},{"key":"42","doi-asserted-by":"publisher","DOI":"10.1002\/1521-3951(200111)228:1&lt;41::AID-PSSB41&gt;3.0.CO;2-N"},{"key":"43","volume":"4","author":"Fu W Y","year":"2011","journal-title":"Appl. Phys. Express","ISSN":"http:\/\/id.crossref.org\/issn\/1882-0786","issn-type":"print"},{"key":"44","doi-asserted-by":"publisher","DOI":"10.1016\/j.nimb.2006.02.004"},{"key":"45","doi-asserted-by":"publisher","DOI":"10.1016\/j.jallcom.2011.07.052"},{"key":"46","doi-asserted-by":"publisher","DOI":"10.1016\/j.susc.2005.10.035"},{"key":"47","doi-asserted-by":"publisher","DOI":"10.1557\/S1092578300000119"},{"key":"48","doi-asserted-by":"publisher","DOI":"10.1116\/1.591394"},{"key":"49","doi-asserted-by":"publisher","DOI":"10.1002\/1521-3951(200111)228:2&lt;505::AID-PSSB505&gt;3.0.CO;2-U"},{"key":"50","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcrysgro.2005.10.080"},{"key":"51","doi-asserted-by":"publisher","DOI":"10.1063\/1.1481786"},{"key":"52","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.64.205311"}],"container-title":["Semiconductor Science and Technology"],"original-title":[],"link":[{"URL":"http:\/\/stacks.iop.org\/0268-1242\/31\/i=6\/a=064002\/pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/stacks.iop.org\/0268-1242\/31\/i=6\/a=064002?key=crossref.2ee7489b8456ecb324ba4c654d2ecbdf","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/stacks.iop.org\/0268-1242\/31\/i=6\/a=064002\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,4,11]],"date-time":"2020-04-11T15:34:51Z","timestamp":1586619291000},"score":1,"resource":{"primary":{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/0268-1242\/31\/6\/064002"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5,19]]},"references-count":52,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2016,6,1]]}},"URL":"https:\/\/doi.org\/10.1088\/0268-1242\/31\/6\/064002","relation":{},"ISSN":["0268-1242","1361-6641"],"issn-type":[{"value":"0268-1242","type":"print"},{"value":"1361-6641","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,5,19]]},"assertion":[{"value":"Semiconductor Science and Technology","name":"journal_title","label":"Journal title"},{"value":"paper","name":"article_type","label":"Article type"},{"value":"Composition measurement of epitaxial ScxGa1\u2212xN films","name":"article_title","label":"Article title"},{"value":"\u00a9 2016 IOP Publishing Ltd","name":"copyright_information","label":"Copyright information"},{"value":"2016-01-27","name":"date_received","label":"Date received","group":{"name":"publication_dates","label":"Publication dates"}},{"value":"2016-04-15","name":"date_accepted","label":"Date accepted","group":{"name":"publication_dates","label":"Publication dates"}},{"value":"2016-05-19","name":"date_epub","label":"Online publication date","group":{"name":"publication_dates","label":"Publication dates"}}]}}