{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,21]],"date-time":"2026-10-21T23:38:31Z","timestamp":1792625911046,"version":"4.5.0"},"reference-count":0,"publisher":"IOP Publishing","license":[{"start":{"date-parts":[[2026,10,21]],"date-time":"2026-10-21T00:00:00Z","timestamp":1792540800000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/publishingsupport.iopscience.iop.org\/iop-standard\/v1"},{"start":{"date-parts":[[2026,10,21]],"date-time":"2026-10-21T00:00:00Z","timestamp":1792540800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/iopscience.iop.org\/info\/page\/text-and-data-mining"}],"funder":[{"name":"National Science Fund","award":["62225102"],"award-info":[{"award-number":["62225102"]}]},{"name":"Quantum Science and Technology-National Science and Technology Major Project","award":["2021ZD0300403"],"award-info":[{"award-number":["2021ZD0300403"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Meas. Sci. Technol."],"abstract":"<jats:title>Abstract<\/jats:title>\n                  <jats:p>Temperature-induced Rb-Xe coupling error is a critical factor limiting the accuracy of miniaturized nuclear magnetic resonance (NMR) sensors. In this work, a temperaturedependent theoretical model is developed to describe how vapor cell temperature affects the output phase of Xe isotope signals through the in-situ Rb atomic magnetometer and the signalprocessing loop. Based on the Bloch equation and demodulation process, the model reveals that temperature variations modify both the magnetic field sensed by Rb atoms and the transverse relaxation time of Rb atoms, thereby producing phase errors in the measured Xe precession signal. Numerical simulations further show that the amplitude and phase of the Xe signal are sensitive to Rb spin-frequency detuning and relaxation-time variation, and that the coupling-induced phase shift becomes more significant at higher Xe spin frequencies. Experiments were performed by measuring the temperature dependences of the light-shift equivalent magnetic field, nuclear-spin equivalent magnetic field, and Rb transverse relaxation time, which were then incorporated into the theoretical model. The calculated phase shifts agree well with the measured results for both 129 Xe and 131 Xe, with R-squared values of 0.9910 and 0.9931, respectively. These results verify the proposed model and demonstrate that temperature-driven variations in Rb-related parameters are the dominant source of Rb-Xe coupling phase error. This study clarifies the temperaturedependent error mechanism in NMR sensors and provides a theoretical basis for improving their long-term accuracy and environmental robustness.<\/jats:p>","DOI":"10.1088\/1361-6501\/aeb718","type":"journal-article","created":{"date-parts":[[2026,10,21]],"date-time":"2026-10-21T22:50:43Z","timestamp":1792623043000},"source":"Crossref","is-referenced-by-count":0,"title":["Temperature-induced Rb-Xe coupling error modeling and analysis in NMR sensors"],"prefix":"10.1088","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6826-1798","authenticated-orcid":false,"given":"Junjie","family":"Zhang","sequence":"first","affiliation":[{"name":"Beihang University School of Instrumentation Science and Opto-electronics Engineering"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xuelie","family":"Wang","sequence":"additional","affiliation":[{"name":"Hefei National Laboratory"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hao","family":"Tian","sequence":"additional","affiliation":[{"name":"Hangzhou Inst Extremely Weak Magnet Field Major Na"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3832-3425","authenticated-orcid":false,"given":"Hanyu","family":"Wang","sequence":"additional","affiliation":[{"name":"Beihang University School of Instrumentation Science and Opto-electronics Engineering"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jianli","family":"Li","sequence":"additional","affiliation":[{"name":"Beihang University School of Instrumentation Science and Opto-electronics Engineering"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhanchao","family":"Liu","sequence":"additional","affiliation":[{"name":"Beihang University School of Instrumentation Science and Opto-electronics Engineering"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"266","published-online":{"date-parts":[[2026,10,21]]},"container-title":["Measurement Science and Technology"],"original-title":[],"link":[{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/1361-6501\/aeb718","content-type":"text\/html","content-version":"am","intended-application":"text-mining"},{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/1361-6501\/aeb718\/pdf","content-type":"application\/pdf","content-version":"am","intended-application":"text-mining"},{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/1361-6501\/aeb718\/pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/1361-6501\/aeb718\/pdf","content-type":"application\/pdf","content-version":"am","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,10,21]],"date-time":"2026-10-21T22:50:43Z","timestamp":1792623043000},"score":1,"resource":{"primary":{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/1361-6501\/aeb718"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,10,21]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1088\/1361-6501\/aeb718","relation":{},"ISSN":["0957-0233","1361-6501"],"issn-type":[{"value":"0957-0233","type":"print"},{"value":"1361-6501","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,10,21]]}}}