{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,21]],"date-time":"2026-09-21T12:20:13Z","timestamp":1789993213013,"version":"4.0.1"},"reference-count":13,"publisher":"Oxford University Press (OUP)","issue":"3","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Microscopy (Tokyo)"],"published-print":{"date-parts":[[2013,6]]},"DOI":"10.1093\/jmicro\/dfs129","type":"journal-article","created":{"date-parts":[[2013,1,11]],"date-time":"2013-01-11T01:36:21Z","timestamp":1357868181000},"page":"391-395","source":"Crossref","is-referenced-by-count":15,"title":["A new grating X-ray spectrometer for 2\u20134 keV enabling a separate observation of In-L\u03b2 and Sn-L\u03b1 emissions of indium tin oxide"],"prefix":"10.1093","volume":"62","author":[{"given":"Masami","family":"Terauchi","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hideyuki","family":"Takahashi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nobuo","family":"Handa","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Takanori","family":"Murano","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Masato","family":"Koike","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tetsuya","family":"Kawachi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Takashi","family":"Imazono","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Noboru","family":"Hasegawa","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Masaru","family":"Koeda","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tetsuya","family":"Nagano","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hiroyuki","family":"Sasai","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuki","family":"Oue","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zeno","family":"Yonezawa","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Satoshi","family":"Kuramoto","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"286","published-online":{"date-parts":[[2013,1,10]]},"reference":[{"key":"2016031018105956000_62.3.391.1","doi-asserted-by":"publisher","DOI":"10.1093\/jmicro\/50.2.101"},{"key":"2016031018105956000_62.3.391.2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2006.04.021"},{"key":"2016031018105956000_62.3.391.3","doi-asserted-by":"publisher","DOI":"10.1093\/jmicro\/dfq010"},{"key":"2016031018105956000_62.3.391.4","doi-asserted-by":"publisher","DOI":"10.1093\/jmicro\/dfr076"},{"key":"2016031018105956000_62.3.391.5","first-page":"23","article-title":"A new WDS spectrometer for valence electron spectroscopy based on electron microscopy","volume":"47","author":"Terauchi","year":"2012","journal-title":"JEOL News"},{"key":"2016031018105956000_62.3.391.6","doi-asserted-by":"publisher","DOI":"10.1364\/AO.51.002351"},{"key":"2016031018105956000_62.3.391.7","doi-asserted-by":"crossref","unstructured":"Spiller E . Reflection optics: multilayers. In: Samson J A Ederer D L , editors. Vacuum Ultraviolet Spectroscopy. San Diego: Academic Press; 2000. p. 271-288.","DOI":"10.1016\/B978-012617560-8\/50015-3"},{"key":"2016031018105956000_62.3.391.8","doi-asserted-by":"crossref","unstructured":"Attwood D . Soft X-Rays and Extreme Ultraviolet Radiations. New York: Cambridge University Press; 2000.","DOI":"10.1017\/CBO9781139164429"},{"key":"2016031018105956000_62.3.391.9","doi-asserted-by":"publisher","DOI":"10.1364\/AO.35.004408"},{"key":"2016031018105956000_62.3.391.10","doi-asserted-by":"crossref","first-page":"8067","DOI":"10.1364\/AO.37.008067","article-title":"Supermirror hard-x-ray telescope","volume":"37","author":"Yahashita","year":"1998","journal-title":"Appl.Opt."},{"key":"2016031018105956000_62.3.391.11","doi-asserted-by":"crossref","first-page":"33","DOI":"10.1063\/1.4737535","article-title":"A multilayer grating with a novel layer structure for a flat-field spectrograph attached to transmission electron microscopes in energy region of 2\u20134 keV","volume":"1465","author":"Imazono","year":"2012","journal-title":"AIP Conf. Proc."},{"key":"2016031018105956000_62.3.391.12","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.39.78"},{"key":"2016031018105956000_62.3.391.13","doi-asserted-by":"crossref","first-page":"601","DOI":"10.1088\/0034-4885\/34\/2\/304","article-title":"Soft x ray spectroscopy and the electronic structure of solids","volume":"34","author":"Fabian","year":"1972","journal-title":"Rep. Prog. Phys."}],"container-title":["Microscopy"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/academic.oup.com\/jmicro\/article-pdf\/62\/3\/391\/11762420\/dfs129.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,7,8]],"date-time":"2019-07-08T01:34:14Z","timestamp":1562549654000},"score":1,"resource":{"primary":{"URL":"https:\/\/academic.oup.com\/jmicro\/article-lookup\/doi\/10.1093\/jmicro\/dfs129"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,1,10]]},"references-count":13,"journal-issue":{"issue":"3","published-online":{"date-parts":[[2013,6,11]]},"published-print":{"date-parts":[[2013,6]]}},"alternative-id":["10.1093\/jmicro\/dfs129"],"URL":"https:\/\/doi.org\/10.1093\/jmicro\/dfs129","relation":{},"ISSN":["2050-5698","2050-5701"],"issn-type":[{"value":"2050-5698","type":"print"},{"value":"2050-5701","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,1,10]]}}}