{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,15]],"date-time":"2026-10-15T19:09:47Z","timestamp":1792091387472,"version":"4.4.0"},"reference-count":40,"publisher":"Oxford University Press (OUP)","issue":"2","license":[{"start":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T00:00:00Z","timestamp":1777420800000},"content-version":"vor","delay-in-days":57,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,3,3]]},"abstract":"<jats:title>Abstract<\/jats:title>\n                  <jats:p>High-resolution transmission electron microscopy (HRTEM) is an important method for imaging beam sensitive materials often under cryo conditions. Electron ptychography in the scanning transmission electron microscope (STEM) has been shown to reconstruct low-noise phase data at a reduced fluence for such materials. This raises the question of whether ptychography or HRTEM provides a more fluence-efficient imaging technique. Even though the transfer function is a common metric for evaluating the performance of an imaging method, it only describes the signal transfer with respect to spatial frequency, irrespective of the noise transfer. It can also not be well defined for methods, such as ptychography, that use an algorithm to form the final image. Here we apply the concept of detective quantum efficiency (DQE) to electron microscopy as a fluence independent and sample independent measure of technique performance. We find that, for a weak-phase object, ptychography can never reach the efficiency of a perfect Zernike phase imaging microscope but that ptychography is more robust to partial coherence.<\/jats:p>","DOI":"10.1093\/mam\/ozag018","type":"journal-article","created":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T12:33:08Z","timestamp":1772368388000},"source":"Crossref","is-referenced-by-count":6,"title":["Detective Quantum Efficiency-Based Comparison of HRTEM and Ptychography Phase Imaging"],"prefix":"10.1093","volume":"32","author":[{"given":"Felix","family":"Bennemann","sequence":"first","affiliation":[{"name":"Department of Materials, University of Oxford , Parks Road, Oxford OX1 3PH ,","place":["UK"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Angus I","family":"Kirkland","sequence":"additional","affiliation":[{"name":"Department of Materials, University of Oxford , Parks Road, Oxford OX1 3PH ,","place":["UK"]},{"name":"The Rosalind Franklin Institute, Building R113, Rutherford Appleton Laboratory , Harwell Campus, Didcot, Oxfordshire OX11 0QX ,","place":["UK"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David A","family":"Muller","sequence":"additional","affiliation":[{"name":"School of Applied and Engineering Physics, Cornell University , Ithaca, NY 14853 ,","place":["USA"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5883-6463","authenticated-orcid":false,"given":"Peter D","family":"Nellist","sequence":"additional","affiliation":[{"name":"Department of Materials, University of Oxford , Parks Road, Oxford OX1 3PH 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