{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,7]],"date-time":"2026-08-07T17:29:11Z","timestamp":1786123751549,"version":"build-2736575974"},"reference-count":45,"publisher":"Oxford University Press (OUP)","issue":"4","license":[{"start":{"date-parts":[[2026,8,7]],"date-time":"2026-08-07T00:00:00Z","timestamp":1786060800000},"content-version":"vor","delay-in-days":37,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,7,1]]},"abstract":"<jats:title>Abstract<\/jats:title>\n                  <jats:p>Programable electron-beam scanning offers new opportunities to improve dose efficiency and suppress scan-induced artifacts in scanning transmission electron microscopy. Here, we systematically benchmark the impact of non-raster trajectories, including spiral and multi-pass sequential patterns, on electron energy-loss spectroscopy (EELS) and ptychography. Using DyScO3 as a model perovskite, we compare spatial resolution, spectral fidelity, and artifact suppression across scan modes. Ptychographic phase reconstructions consistently achieve atomic resolution and remain robust to large jumps in probe position. In contrast, atomic-resolution EELS maps show pronounced sensitivity to probe motion, with sequential and spiral scans introducing non-uniform elemental contrast. Finally, spiral scanning applied under cryogenic conditions in BTO thin films improves dose uniformity and mitigates drift-related distortions. These results establish practical guidelines for the implementation of non-raster scan strategies in 4D-STEM and highlight the inherent resilience of ptychography to trajectory-induced artifacts.<\/jats:p>","DOI":"10.1093\/mam\/ozag080","type":"journal-article","created":{"date-parts":[[2026,7,14]],"date-time":"2026-07-14T11:40:03Z","timestamp":1784029203000},"source":"Crossref","is-referenced-by-count":0,"title":["Programable Beam Control for Electron Energy-Loss Spectroscopy and Ptychography"],"prefix":"10.1093","volume":"32","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-7522-1664","authenticated-orcid":false,"given":"Mariana","family":"Palos","sequence":"first","affiliation":[{"name":"Department of Materials, London Centre of Nanotechnology, Imperial College London , Exhibition Road, London SW7 2AZ ,","place":["UK"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Liam","family":"Spillane","sequence":"additional","affiliation":[{"name":"Gatan Inc. , 5794 W. Las Positas Blvd., Pleasanton, CA 94588 ,","place":["USA"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Geri","family":"Topore","sequence":"additional","affiliation":[{"name":"Department of Materials, London Centre of Nanotechnology, Imperial College London , Exhibition Road, London SW7 2AZ ,","place":["UK"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yaqi","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Materials, London Centre of Nanotechnology, Imperial College London , Exhibition Road, London SW7 2AZ ,","place":["UK"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David","family":"Pesquera","sequence":"additional","affiliation":[{"name":"Catalan Institute of Nanoscience and Nanotechnology (ICN2) , Bellaterra, Barcelona 08193 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