{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T17:29:10Z","timestamp":1783013350894,"version":"3.54.6"},"reference-count":22,"publisher":"Oxford University Press (OUP)","issue":"3","license":[{"start":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T00:00:00Z","timestamp":1684108800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,9]]},"abstract":"<jats:title>Abstract<\/jats:title>\n               <jats:p>The size of nanoparticles is a critical parameter with regard to their performance. Therefore, precise measurement of the size distribution is often required. While electron microscopy (EM) is a useful tool to image large numbers of particles at once, manual analysis of individual particles in EM images is a time-consuming and labor-intensive task. Therefore, reliable automatic detection methods have long been desired. This paper introduces a novel automatic particle analysis software package based on the circular Hough transform (CHT). Our software package includes novel features to enhance precise particle analysis capabilities. We applied the CHT algorithm in an iterative workflow, which ensures optimal detection over wide radius intervals, to deal with overlapping particles. In addition, smart intensity criteria were implemented to resolve common difficult cases that lead to false particle detection. Implementing these criteria enabled an effective and precise analysis by minimizing detection of false particles. Overall, our approach showed reliable particle analysis results by resolving common types of particle overlaps and deformation with only negligible errors.<\/jats:p>","DOI":"10.1093\/micmic\/ozad036","type":"journal-article","created":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T12:07:44Z","timestamp":1684152464000},"page":"1062-1070","source":"Crossref","is-referenced-by-count":7,"title":["Smart Iterative Analysis Tool for the Size Distribution of Spherical Nanoparticles"],"prefix":"10.1093","volume":"29","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6246-3735","authenticated-orcid":false,"given":"Jannik","family":"Guckel","sequence":"first","affiliation":[{"name":"Physikalisch-Technische Bundesanstalt , Bundesallee 100, Braunschweig 38116 , Germany"},{"name":"Laboratory of Emerging Nanometrology (LENA) , Langer Kamp 6, 38106 Braunschweig , 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