{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T20:43:13Z","timestamp":1773780193142,"version":"3.50.1"},"reference-count":0,"publisher":"International Union of Crystallography (IUCr)","issue":"5","license":[{"start":{"date-parts":[[2004,8,26]],"date-time":"2004-08-26T00:00:00Z","timestamp":1093478400000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/journals.iucr.org\/services\/copyrightpolicy.html"},{"start":{"date-parts":[[2004,8,26]],"date-time":"2004-08-26T00:00:00Z","timestamp":1093478400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/journals.iucr.org\/services\/copyrightpolicy.html#TDM"}],"content-domain":{"domain":["iucr.org","wiley.com","iucrj.org"],"crossmark-restriction":true},"short-container-title":["Acta Crystallogr A Found Crystallogr","Acta Cryst A","Acta Cryst Sect A","Acta Crystallogr A","Acta Crystallogr Sect A","Acta Crystallogr Sect A Found Crystallogr"],"accepted":{"date-parts":[[2004,7,7]]},"published-print":{"date-parts":[[2004,9,1]]},"abstract":"<jats:p>For the measurement of very accurate high-resolution X-ray data for charge-density work, synchrotron beamlines provide a bright radiation source of outstanding properties. Most important are the very high primary intensity and the possibility of choosing hard radiation with \u03bb \u2248 0.5\u2005\u00c5 or even shorter. This together with area detection and a stable low-temperature device means that accurate and large data sets can be measured in a short time. A number of data collections are reported, which were carried out at the beamlines F1 and D3 of Hasylab (DESY, Hamburg) first at 100\u2005K and later at 15\u201320\u2005K, demonstrating the quality of the measured intensities. A low temperature of around 20\u2005K was obtained at beamline D3 with a double-stage closed-cycle helium cryostat where the standard beryllium cylinder of the vacuum chamber was replaced by a 0.1\u2005mm Kapton film. Comparison of different data sets measured for a strychnine crystal demonstrated how <jats:italic>I<\/jats:italic>\/\u03c3 ratios favorably improve if synchrotron radiation at a low temperature of 15\u2005K was used. Synchrotron-based studies on several biologically active compounds are briefly summarized and a synchrotron experiment of an otherwise not sufficiently diffracting crystal of a tetraphenyl barbaralane derivative is described in detail. Atomic volumes and charges of a highly substituted C<jats:sub>60<\/jats:sub> fullerene are reported derived from a synchrotron data set of more than 350000 reflections.<\/jats:p>","DOI":"10.1107\/s0108767304014825","type":"journal-article","created":{"date-parts":[[2004,8,26]],"date-time":"2004-08-26T10:11:59Z","timestamp":1093515119000},"page":"390-396","update-policy":"https:\/\/doi.org\/10.1107\/cm_01","source":"Crossref","is-referenced-by-count":23,"title":["High-resolution synchrotron data collection for charge-density work at 100 and 20\u2005K"],"prefix":"10.1107","volume":"60","author":[{"given":"Peter","family":"Luger","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marc","family":"Messerschmidt","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stephan","family":"Scheins","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Armin","family":"Wagner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"329","published-online":{"date-parts":[[2004,8,26]]},"container-title":["Acta Crystallographica Section A Foundations of Crystallography"],"original-title":[],"link":[{"URL":"http:\/\/journals.iucr.org\/a\/issues\/2004\/05\/00\/xc5002\/xc5002.pdf","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/journals.iucr.org\/a\/issues\/2004\/05\/00\/xc5002\/xc5002.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,11]],"date-time":"2025-01-11T13:47:01Z","timestamp":1736603221000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.iucr.org\/paper?S0108767304014825"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004,8,26]]},"references-count":0,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2004,9]]}},"alternative-id":["S0108767304014825"],"URL":"https:\/\/doi.org\/10.1107\/s0108767304014825","relation":{"is-supplemented-by":[{"id-type":"doi","id":"10.1107\/S0108767304014825\/xc5002sup1.cif","asserted-by":"subject"},{"id-type":"doi","id":"10.1107\/S0108767304014825\/xc5002Isup2.hkl","asserted-by":"subject"}]},"ISSN":["0108-7673"],"issn-type":[{"value":"0108-7673","type":"print"}],"subject":[],"published":{"date-parts":[[2004,8,26]]},"assertion":[{"value":"Acta Crystallographica Section A: Foundations of Crystallography","order":0,"name":"journal","label":"Publication","explanation":{"URL":"http:\/\/journals.iucr.org\/a"},"group":{"name":"general","label":"General"}},{"value":"research papers","order":1,"name":"content_type","label":"Content type","explanation":{"URL":"https:\/\/journals.iucr.org\/a\/services\/notesforauthors.html"},"group":{"name":"general","label":"General"}},{"value":"Available","URL":"https:\/\/scripts.iucr.org\/cgi-bin\/citedin?xc5002","order":2,"name":"article_metrics","label":"Article metrics","group":{"name":"general","label":"General"}},{"value":"Yes","order":0,"name":"peer_reviewed","label":"Peer reviewed","group":{"name":"peer_review","label":"Peer review"}},{"value":"Single blind","order":1,"name":"review_process","label":"Review process","group":{"name":"peer_review","label":"Peer review"}},{"value":"29 January 2004","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication history"}},{"value":"7 July 2004","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication history"}},{"value":"26 August 2004","order":2,"name":"published_online","label":"Published online","group":{"name":"publication_history","label":"Publication history"}},{"value":"This article has supporting information","name":"supplementary_materials","label":"Supplementary materials","explanation":{"URL":"https:\/\/scripts.iucr.org\/cgi-bin\/sendsup?xc5002"}},{"value":"\u00a9 2004 International Union of Crystallography","order":0,"name":"copyright","label":"Copyright","explanation":{"URL":"http:\/\/journals.iucr.org\/services\/copyrightpolicy.html"},"group":{"name":"copyright_and_licensing","label":"Copyright and licencing"}}]}}