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The beamline and the end-station at branch B have been recently upgraded, enabling microscopic XPS, XAS, and ARPES measurements to be performed. In 2015, a planar undulator insertion device was replaced with an APPLE-II (advanced planar polarized light emitter II) undulator. This replacement allows use of linear, circular, and elliptical polarized light between 48 and 2000\u2005eV with photon intensities of 10<jats:sup>9<\/jats:sup>\u201310<jats:sup>13<\/jats:sup>\u2005photons\u2005s<jats:sup>\u22121<\/jats:sup>. For microscopic measurements, a toroidal post-mirror was renewed to have more focused beam with profile sizes of 78\u2005\u00b5m (horizontal) \u00d7 15\u2005\u00b5m (vertical) and 84\u2005\u00b5m \u00d7 11\u2005\u00b5m at photon energies of 100 and 400\u2005eV, respectively. A high-precision sample manipulator composed of an <jats:italic>XYZ<\/jats:italic> translator, a rotary feedthrough, and a newly developed goniometer, which is essential for microscopic measurements, has been used to control a sample specimen in six degrees of freedom, <jats:italic>i.e.<\/jats:italic> translation in the <jats:italic>X<\/jats:italic>, <jats:italic>Y<\/jats:italic>, and <jats:italic>Z<\/jats:italic> directions and rotation in the polar, azimuthal, and tilt directions. To demonstrate the performance of the focused beams, one- and two-dimensional XPS and XAS scan measurements of a copper grid have been performed. It was indicated from analysis of XPS and XAS intensity maps that the actual spatial resolution can be determined by the beam size.<\/jats:p>","DOI":"10.1107\/s160057752200090x","type":"journal-article","created":{"date-parts":[[2022,2,16]],"date-time":"2022-02-16T18:48:55Z","timestamp":1645037335000},"page":"400-408","update-policy":"https:\/\/doi.org\/10.1107\/cm_01","source":"Crossref","is-referenced-by-count":17,"title":["Beamline commissioning for microscopic measurements with ultraviolet and soft X-ray beam at the upgraded beamline BL-13B of the Photon Factory"],"prefix":"10.1107","volume":"29","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2157-4671","authenticated-orcid":true,"given":"Kenichi","family":"Ozawa","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4478-7680","authenticated-orcid":true,"given":"Yoshihiro","family":"Aiura","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2623-5735","authenticated-orcid":true,"given":"Daisuke","family":"Wakabayashi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4897-351X","authenticated-orcid":true,"given":"Hirokazu","family":"Tanaka","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Takashi","family":"Kikuchi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Akio","family":"Toyoshima","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3613-0021","authenticated-orcid":true,"given":"Kazuhiko","family":"Mase","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"329","published-online":{"date-parts":[[2022,2,16]]},"reference":[{"key":"yi5118_bb1","doi-asserted-by":"crossref","first-page":"035106","DOI":"10.1063\/1.3693277","volume":"83","author":"Aiura","year":"2012","journal-title":"Rev. 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