{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,31]],"date-time":"2026-10-31T12:42:53Z","timestamp":1793450573487,"version":"4.5.0"},"reference-count":48,"publisher":"International Union of Crystallography (IUCr)","issue":"1","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100002835","name":"Chalmers Tekniska H","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002835","id-type":"DOI","asserted-by":"publisher"}]},{"name":"MAX IV"}],"content-domain":{"domain":["iucr.org","wiley.com","iucrj.org"],"crossmark-restriction":true},"short-container-title":["J Synchrotron Rad","J Synchrotron Radiat"],"accepted":{"date-parts":[[2023,11,21]]},"published-print":{"date-parts":[[2024,1,1]]},"abstract":"<jats:p>\n                    The use of hard X-ray transmission nano- and microdiffraction to perform\n                    <jats:italic>in situ<\/jats:italic>\n                    stress and strain measurements during deformation has recently been demonstrated and used to investigate many thin film systems. Here a newly commissioned sample environment based on a commercially available nanoindenter is presented, which is available at the NanoMAX beamline at the MAX IV synchrotron. Using X-ray nanoprobes of around 60\u201370\u2005nm at 14\u201316\u2005keV and a scanning step size of 100\u2005nm, we map the strains, stresses, plastic deformation and fracture during nanoindentation of industrial coatings with thicknesses in the range of several micrometres, relatively strong texture and large grains. The successful measurements of such challenging samples illustrate broad applicability. The sample environment is openly accessible for NanoMAX beamline users through the MAX IV sample environment pool, and its capability can be further extended for specific purposes through additional available modules.\n                  <\/jats:p>","DOI":"10.1107\/s1600577523010093","type":"journal-article","created":{"date-parts":[[2023,12,8]],"date-time":"2023-12-08T11:27:40Z","timestamp":1702034860000},"page":"42-54","update-policy":"https:\/\/doi.org\/10.1107\/cm_01","source":"Crossref","is-referenced-by-count":9,"title":["<i>In situ<\/i>\n                    characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy"],"prefix":"10.1107","volume":"31","author":[{"given":"Gudrun","family":"Lotze","sequence":"first","affiliation":[{"id":[{"id":"https:\/\/ror.org\/03q28x580","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Anand H. S.","family":"Iyer","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/040wg7k59","id-type":"ROR","asserted-by":"publisher"}],"department":["Department of Physics"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Olof","family":"B\u00e4cke","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/040wg7k59","id-type":"ROR","asserted-by":"publisher"}],"department":["Department of Physics"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sebastian","family":"Kalbfleisch","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/03q28x580","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Magnus H\u00f6rnqvist","family":"Colliander","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/040wg7k59","id-type":"ROR","asserted-by":"publisher"}],"department":["Department of Physics"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"329","published-online":{"date-parts":[[2024,1,1]]},"reference":[{"key":"vl5017_bb1","doi-asserted-by":"crossref","first-page":"101833","DOI":"10.1016\/j.mtla.2023.101833","volume":"30","author":"B\u00e4cke","year":"2023","journal-title":"Materialia"},{"key":"vl5017_bb2","doi-asserted-by":"crossref","first-page":"153","DOI":"10.1016\/j.scriptamat.2015.06.008","volume":"107","author":"Bartosik","year":"2015","journal-title":"Scr. Mater."},{"key":"vl5017_bb3","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/j.tsf.2013.05.102","volume":"542","author":"Bartosik","year":"2013","journal-title":"Thin Solid Films"},{"key":"vl5017_bb4","doi-asserted-by":"crossref","first-page":"5069","DOI":"10.1364\/OE.386068","volume":"28","author":"Bj\u00f6rling","year":"2020","journal-title":"Opt. Express"},{"key":"vl5017_bb5","doi-asserted-by":"crossref","first-page":"876","DOI":"10.1107\/S1600577522001333","volume":"29","author":"Carbone","year":"2022","journal-title":"J. Synchrotron Rad."},{"key":"vl5017_bb6","doi-asserted-by":"crossref","first-page":"203507","DOI":"10.1063\/1.4879243","volume":"115","author":"Daniel","year":"2014","journal-title":"J. Appl. Phys."},{"key":"vl5017_bb7","doi-asserted-by":"crossref","first-page":"6255","DOI":"10.1016\/j.actamat.2013.07.009","volume":"61","author":"Daniel","year":"2013","journal-title":"Acta Mater."},{"key":"vl5017_bb8","doi-asserted-by":"crossref","first-page":"235301","DOI":"10.1063\/1.4922666","volume":"117","author":"Daniel","year":"2015","journal-title":"J. Appl. Phys."},{"key":"vl5017_bb9","doi-asserted-by":"crossref","first-page":"108478","DOI":"10.1016\/j.matdes.2020.108478","volume":"188","author":"Ecker","year":"2020","journal-title":"Mater. Des."},{"key":"vl5017_bb10","unstructured":"Esteves, G., Ramos, K., Fancher, C. M. & Jones, J. L. (2017). LIPRAS: Line-Profile Analysis Software, Technical Report, pp. 1-3. doi: https:\/\/doi.org\/10.13140\/RG.2.2.29970.25282\/3."},{"key":"vl5017_bb11","doi-asserted-by":"crossref","first-page":"031907","DOI":"10.1063\/1.4939981","volume":"108","author":"Gamcov\u00e1","year":"2016","journal-title":"Appl. Phys. Lett."},{"key":"vl5017_bb12","doi-asserted-by":"crossref","first-page":"114","DOI":"10.1017\/S0885715612000267","volume":"27","author":"Gn\u00e4upel-Herold","year":"2012","journal-title":"Powder Diffr."},{"key":"vl5017_bb13","doi-asserted-by":"crossref","first-page":"666","DOI":"10.1016\/j.carbon.2018.12.093","volume":"144","author":"Gruber","year":"2019","journal-title":"Carbon"},{"key":"vl5017_bb14","doi-asserted-by":"crossref","first-page":"111535","DOI":"10.1016\/j.matdes.2022.111535","volume":"225","author":"Heinze","year":"2023","journal-title":"Mater. Des."},{"key":"vl5017_bb15","doi-asserted-by":"crossref","first-page":"2001525","DOI":"10.1002\/adem.202001525","volume":"23","author":"Hinzmann","year":"2021","journal-title":"Adv. Eng. Mater."},{"key":"vl5017_bb16","doi-asserted-by":"crossref","first-page":"1234","DOI":"10.1126\/science.1202366","volume":"334","author":"Ice","year":"2011","journal-title":"Science"},{"key":"vl5017_bb17","doi-asserted-by":"crossref","first-page":"55","DOI":"10.1016\/j.actamat.2018.09.031","volume":"162","author":"J\u00e4ger","year":"2019","journal-title":"Acta Mater."},{"key":"vl5017_bb18","doi-asserted-by":"crossref","first-page":"1935","DOI":"10.1107\/S1600577521008213","volume":"28","author":"Johansson","year":"2021","journal-title":"J. Synchrotron Rad."},{"key":"vl5017_bb19","doi-asserted-by":"crossref","first-page":"748","DOI":"10.1016\/j.scriptamat.2012.07.034","volume":"67","author":"Keckes","year":"2012","journal-title":"Scr. Mater."},{"key":"vl5017_bb20","doi-asserted-by":"crossref","first-page":"862","DOI":"10.1016\/j.actamat.2017.11.049","volume":"144","author":"Keckes","year":"2018","journal-title":"Acta Mater."},{"key":"vl5017_bb21","doi-asserted-by":"crossref","first-page":"558","DOI":"10.1107\/S1600577520000776","volume":"27","author":"Kieffer","year":"2020","journal-title":"J. Synchrotron Rad."},{"key":"vl5017_bb22","doi-asserted-by":"crossref","first-page":"107702","DOI":"10.1016\/j.matdes.2019.107702","volume":"170","author":"Klima","year":"2019","journal-title":"Mater. Des."},{"key":"vl5017_bb23","doi-asserted-by":"crossref","first-page":"504","DOI":"10.1007\/BF01337948","volume":"151","author":"Kr\u00f6ner","year":"1958","journal-title":"Z. Phys."},{"key":"vl5017_bb24","doi-asserted-by":"crossref","unstructured":"Martinez-Criado, G. (2015). Synchrotron Light Sources and Free-Electron Lasers, pp. 1-31. Springer International Publishing.","DOI":"10.1007\/978-3-319-04507-8_46-1"},{"key":"vl5017_bb25","doi-asserted-by":"crossref","first-page":"109365","DOI":"10.1016\/j.matdes.2020.109365","volume":"198","author":"Meindlhumer","year":"2021","journal-title":"Mater. Des."},{"key":"vl5017_bb26","doi-asserted-by":"crossref","first-page":"11","DOI":"10.1016\/j.scriptamat.2020.02.031","volume":"182","author":"Meindlhumer","year":"2020","journal-title":"Scr. Mater."},{"key":"vl5017_bb27","doi-asserted-by":"crossref","first-page":"109023","DOI":"10.1016\/j.matdes.2020.109023","volume":"195","author":"Meindlhumer","year":"2020","journal-title":"Mater. Des."},{"key":"vl5017_bb28","doi-asserted-by":"crossref","first-page":"127076","DOI":"10.1016\/j.surfcoat.2021.127076","volume":"413","author":"Qiu","year":"2021","journal-title":"Surf. Coat. Technol."},{"key":"vl5017_bb29","doi-asserted-by":"crossref","first-page":"100546","DOI":"10.1016\/j.mtla.2019.100546","volume":"9","author":"Qiu","year":"2020","journal-title":"Materialia"},{"key":"vl5017_bb30","doi-asserted-by":"crossref","first-page":"108","DOI":"10.1016\/j.surfcoat.2014.03.045","volume":"257","author":"Riedl","year":"2014","journal-title":"Surf. Coat. Technol."},{"key":"vl5017_bb31","doi-asserted-by":"crossref","first-page":"137576","DOI":"10.1016\/j.tsf.2019.137576","volume":"691","author":"Saghaeian","year":"2019","journal-title":"Thin Solid Films"},{"key":"vl5017_bb32","doi-asserted-by":"crossref","first-page":"121","DOI":"10.1016\/j.surfcoat.2014.09.050","volume":"258","author":"Schalk","year":"2014","journal-title":"Surf. Coat. Technol."},{"key":"vl5017_bb33","doi-asserted-by":"crossref","first-page":"155","DOI":"10.1016\/j.surfcoat.2018.12.058","volume":"359","author":"Schalk","year":"2019","journal-title":"Surf. Coat. Technol."},{"key":"vl5017_bb34","doi-asserted-by":"crossref","first-page":"188","DOI":"10.1016\/j.cossms.2018.09.003","volume":"22","author":"Sch\u00fclli","year":"2018","journal-title":"Curr. Opin. Solid State Mater. Sci."},{"key":"vl5017_bb35","doi-asserted-by":"crossref","first-page":"105125","DOI":"10.1016\/j.ijrmhm.2019.105125","volume":"87","author":"Shoja","year":"2020","journal-title":"Int. J. Refract. Met. Hard Mater."},{"key":"vl5017_bb36","doi-asserted-by":"crossref","first-page":"24","DOI":"10.1016\/j.actamat.2014.11.011","volume":"85","author":"Stefenelli","year":"2015","journal-title":"Acta Mater."},{"key":"vl5017_bb37","doi-asserted-by":"crossref","first-page":"1378","DOI":"10.1107\/S0021889813019535","volume":"46","author":"Stefenelli","year":"2013","journal-title":"J. Appl. Cryst."},{"key":"vl5017_bb38","doi-asserted-by":"crossref","first-page":"231902","DOI":"10.1063\/1.3524502","volume":"97","author":"Tasn\u00e1di","year":"2010","journal-title":"Appl. Phys. Lett."},{"key":"vl5017_bb39","doi-asserted-by":"crossref","first-page":"134","DOI":"10.1016\/j.surfcoat.2014.12.028","volume":"262","author":"Tkadletz","year":"2015","journal-title":"Surf. Coat. Technol."},{"key":"vl5017_bb40","doi-asserted-by":"crossref","first-page":"100696","DOI":"10.1016\/j.mtla.2020.100696","volume":"11","author":"Tkadletz","year":"2020","journal-title":"Materialia"},{"key":"vl5017_bb41","doi-asserted-by":"crossref","first-page":"280","DOI":"10.1016\/j.ijrmhm.2017.11.043","volume":"71","author":"Tkadletz","year":"2018","journal-title":"Int. J. Refract. Met. Hard Mater."},{"key":"vl5017_bb42","doi-asserted-by":"crossref","first-page":"425","DOI":"10.1016\/j.actamat.2020.05.056","volume":"195","author":"Todt","year":"2020","journal-title":"Acta Mater."},{"key":"vl5017_bb43","doi-asserted-by":"crossref","first-page":"2100130","DOI":"10.1002\/adem.202100130","volume":"23","author":"Todt","year":"2021","journal-title":"Adv. Eng. Mater."},{"key":"vl5017_bb44","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1107\/S0021889804029516","volume":"38","author":"Welzel","year":"2005","journal-title":"J. Appl. Cryst."},{"key":"vl5017_bb45","doi-asserted-by":"crossref","first-page":"212","DOI":"10.1016\/j.actamat.2015.09.007","volume":"102","author":"Zalesak","year":"2016","journal-title":"Acta Mater."},{"key":"vl5017_bb46","doi-asserted-by":"crossref","first-page":"2217","DOI":"10.1107\/S1600576716017258","volume":"49","author":"Zalesak","year":"2016","journal-title":"J. Appl. Cryst."},{"key":"vl5017_bb47","doi-asserted-by":"crossref","first-page":"118260","DOI":"10.1016\/j.actamat.2022.118260","volume":"239","author":"Zauner","year":"2022","journal-title":"Acta Mater."},{"key":"vl5017_bb48","doi-asserted-by":"crossref","first-page":"22670","DOI":"10.1038\/srep22670","volume":"6","author":"Zeilinger","year":"2016","journal-title":"Sci. Rep."}],"updated-by":[{"DOI":"10.1107\/s1600577524006283","type":"correction","label":"Correction","source":"publisher","updated":{"date-parts":[[2024,8,6]],"date-time":"2024-08-06T00:00:00Z","timestamp":1722902400000}}],"container-title":["Journal of Synchrotron Radiation"],"original-title":[],"link":[{"URL":"https:\/\/journals.iucr.org\/s\/issues\/2024\/01\/00\/vl5017\/vl5017.pdf","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.iucr.org\/s\/issues\/2024\/01\/00\/vl5017\/vl5017.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,30]],"date-time":"2024-08-30T10:37:06Z","timestamp":1725014226000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.iucr.org\/paper?S1600577523010093"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,1,1]]},"references-count":48,"journal-issue":{"issue":"1","published-online":{"date-parts":[[2024,1]]}},"alternative-id":["S1600577523010093"],"URL":"https:\/\/doi.org\/10.1107\/s1600577523010093","relation":{},"ISSN":["1600-5775"],"issn-type":[{"value":"1600-5775","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,1,1]]},"assertion":[{"value":"Journal of Synchrotron Radiation","order":0,"name":"journal","label":"Publication","explanation":{"URL":"https:\/\/journals.iucr.org\/s"},"group":{"name":"general","label":"General"}},{"value":"research papers","order":1,"name":"content_type","label":"Content type","explanation":{"URL":"https:\/\/journals.iucr.org\/s\/services\/notesforauthors.html"},"group":{"name":"general","label":"General"}},{"value":"Available","URL":"https:\/\/scripts.iucr.org\/cgi-bin\/citedin?vl5017","order":2,"name":"article_metrics","label":"Article metrics","group":{"name":"general","label":"General"}},{"value":"Yes","order":0,"name":"peer_reviewed","label":"Peer reviewed","group":{"name":"peer_review","label":"Peer review"}},{"value":"Single blind","order":1,"name":"review_process","label":"Review process","group":{"name":"peer_review","label":"Peer review"}},{"value":"20 September 2023","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication history"}},{"value":"21 November 2023","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication history"}},{"value":"1 January 2024","order":2,"name":"published_online","label":"Published online","group":{"name":"publication_history","label":"Publication history"}},{"value":"\u00a9 2024 Gudrun Lotze\n                      et al.","order":0,"name":"copyright","label":"Copyright","explanation":{"URL":"https:\/\/journals.iucr.org\/services\/copyrightpolicy.html"},"group":{"name":"copyright_and_licencing","label":"Copyright and licencing"}},{"value":"Creative Commons Attribution (CC-BY)","order":1,"name":"license","label":"Licence","explanation":{"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"},"group":{"name":"copyright_and_licencing","label":"Copyright and licencing"}}]}}