{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T17:55:49Z","timestamp":1754157349950,"version":"3.41.2"},"reference-count":9,"publisher":"Emerald","issue":"2","license":[{"start":{"date-parts":[[2006,3,1]],"date-time":"2006-03-01T00:00:00Z","timestamp":1141171200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.emerald.com\/insight\/site-policies"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2006,3,1]]},"abstract":"<jats:sec><jats:title content-type=\"abstract-heading\">Purpose<\/jats:title><jats:p>For semiconductor and gene\u2010chip microarray fabrication, robots are widely used to handle workpieces. It is critical that robots can calibrate themselves regularly and estimate workpiece pose automatically. This paper proposes an industrial method for automatic robot calibration and workpiece pose estimation.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Design\/methodology\/approach<\/jats:title><jats:p>The methods have been implemented using an air\u2010pressure sensor and a laser sensor.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Findings<\/jats:title><jats:p>Experimental results conducted in an industrial manufacturing environment show efficiency of the methods.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Originality\/value<\/jats:title><jats:p>The contribution of this paper consists of an industrial solution to automatic robot calibration and workpiece pose estimation for automatic semiconductor and gene\u2010chip microarray fabrication.<\/jats:p><\/jats:sec>","DOI":"10.1108\/01439910610651383","type":"journal-article","created":{"date-parts":[[2006,7,3]],"date-time":"2006-07-03T17:52:05Z","timestamp":1151949125000},"page":"88-96","source":"Crossref","is-referenced-by-count":1,"title":["An industrial solution to automatic robot calibration and workpiece pose estimation for semiconductor and gene\u2010chip microarray fabrication"],"prefix":"10.1108","volume":"33","author":[{"given":"Mingjun","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weimin","family":"Tao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"William","family":"Fisher","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tzyh\u2010Jong","family":"Tarn","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"140","reference":[{"key":"key2022012920300536700_b5","doi-asserted-by":"crossref","unstructured":"Blanco, D., Boada, B.L., Moreno, L. and Salichs, M.A. (2000), \u201cLocal mapping from on\u2010line laser Voronoi extraction\u201d, Proceedings of the IEEE\/RSJ International Conference on Intelligent Robots and Systems, pp. 103\u20108.","DOI":"10.1109\/IROS.2000.894589"},{"key":"key2022012920300536700_b1","doi-asserted-by":"crossref","unstructured":"Chen, N.Y., Birk, J. and Kelley, R. 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