{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,17]],"date-time":"2025-11-17T14:12:23Z","timestamp":1763388743198,"version":"3.41.2"},"reference-count":30,"publisher":"Emerald","issue":"4","license":[{"start":{"date-parts":[[2011,6,21]],"date-time":"2011-06-21T00:00:00Z","timestamp":1308614400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.emerald.com\/insight\/site-policies"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,6,21]]},"abstract":"<jats:sec><jats:title content-type=\"abstract-heading\">Purpose<\/jats:title><jats:p>The purpose of this paper is to develop a robot vision system for surface defect detection of 3D objects. It aims at the ill\u2010defined qualitative items such as stains and scratches.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Design\/methodology\/approach<\/jats:title><jats:p>A robot vision system for surface defect detection may counter: high surface reflection at some viewing angles; and no reference markers in any sensed images for matching. A filtering process is used to separate the illumination and reflection components of an image. An automatic marker\u2010selection process and a template\u2010matching method are then proposed for image registration and anomaly detection in reflection\u2010free images.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Findings<\/jats:title><jats:p>Tests were performed on a variety of hand\u2010held electronic devices such as cellular phones. Experimental results show that the proposed system can reliably avoid reflection surfaces and effectively identify small local defects on the surfaces in different viewing angles.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Practical implications<\/jats:title><jats:p>The results have practical implications for industrial objects with arbitrary surfaces.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Originality\/value<\/jats:title><jats:p>Traditional visual inspection systems mainly work for two\u2010dimensional planar surfaces such as printed circuit boards and wafers. The proposed system can find the viewing angles with minimum surface reflection and detect small local defects under image misalignment for three\u2010dimensional objects.<\/jats:p><\/jats:sec>","DOI":"10.1108\/01439911111132076","type":"journal-article","created":{"date-parts":[[2011,7,25]],"date-time":"2011-07-25T11:19:40Z","timestamp":1311592780000},"page":"381-398","source":"Crossref","is-referenced-by-count":5,"title":["Surface defect detection of 3D objects using robot vision"],"prefix":"10.1108","volume":"38","author":[{"given":"Ya\u2010Hui","family":"Tsai","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Du\u2010Ming","family":"Tsai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wei\u2010Chen","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wei\u2010Yao","family":"Chiu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ming\u2010Chin","family":"Lin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"140","reference":[{"key":"key2022021119555319800_b1","unstructured":"Chen, S.Y. and Li, Y.F. 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