{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T17:57:48Z","timestamp":1754157468720,"version":"3.41.2"},"reference-count":7,"publisher":"Emerald","issue":"3\/4","license":[{"start":{"date-parts":[[2009,4,10]],"date-time":"2009-04-10T00:00:00Z","timestamp":1239321600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.emerald.com\/insight\/site-policies"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,4,10]]},"abstract":"<jats:sec><jats:title content-type=\"abstract-heading\">Purpose<\/jats:title><jats:p>The purpose of this paper is to put forward a method which uses a computer to make a large number of simulated tests and determine the reference value of a system reliability index according to a unit reliability index.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Design\/methodology\/approach<\/jats:title><jats:p>At the beginning of conducting an index demonstration and development on a new system, its unit reliability index can already reflect the unit reliability level accurately. Based on this characteristic, this index is used as the confidence lower limit of single side estimated in the unit reliability interval to find the failure distribution law of the unit. On this basis, a great number of simulated tests are made by a computer to calculate the unit failure number and reliability point estimated value every test.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Findings<\/jats:title><jats:p>The confidence lower limit of single side estimated in the system reliability interval is found by counting up the simulated test data of these units.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Research limitations\/implications<\/jats:title><jats:p>Availability of data is the main limitation regarding which model will be applied.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Practical implications<\/jats:title><jats:p>A useful advice for system reliability analysis and calculation.<\/jats:p><\/jats:sec><jats:sec><jats:title content-type=\"abstract-heading\">Originality\/value<\/jats:title><jats:p>This paper presents a new approach of system reliability analysis.<\/jats:p><\/jats:sec>","DOI":"10.1108\/03684920910944056","type":"journal-article","created":{"date-parts":[[2009,5,30]],"date-time":"2009-05-30T07:05:55Z","timestamp":1243667155000},"page":"362-368","source":"Crossref","is-referenced-by-count":0,"title":["A computational method of system reliability of a successful product based on a simulated test"],"prefix":"10.1108","volume":"38","author":[{"given":"Dongqing","family":"Liu","sequence":"first","affiliation":[]},{"given":"Bo","family":"Zheng","sequence":"additional","affiliation":[]},{"given":"Pengcheng","family":"Yan","sequence":"additional","affiliation":[]}],"member":"140","reference":[{"key":"key2022021220114973800_frd1","doi-asserted-by":"crossref","unstructured":"Bo, Z. and Fangping, C. (2004), \u201cEvaluation of system storage reliability\u201d, Kybernetes, Vol. 33 No. 2, pp. 438\u201045.","DOI":"10.1108\/03684920410514463"},{"key":"key2022021220114973800_frd2","unstructured":"Hu, H., Tian, Y., Xiang, Z. and Deng, W. (2004), \u201cMaterials procurement comprehensive evaluation target system and a new\u2010style quality control model\u201d, Advances in Systems Science and Applications, Vol. 3, pp. 417\u201023."},{"key":"key2022021220114973800_frd3","unstructured":"Li, Z., Wang, Y. and Hu, B. (2005), \u201cQualitative simulation method for CIO selection based on P\u2010O fit\u201d, Advances in Systems Science and Applications, Vol. 4, pp. 603\u201010."},{"key":"key2022021220114973800_frd4","unstructured":"Shisong, M. and Lingling, W. (1986), Reliability Statistics, The Press of Pedagogical University of East China, Shanghai, pp. 125\u201036."},{"key":"key2022021220114973800_frd5","unstructured":"Shusen, D. (1984), A Reliability Test and Its Statistical Analysis, The Press of National Defence Industry, Beijing, pp. 217\u201053."},{"key":"key2022021220114973800_frd6","unstructured":"Wang, L. and Li, C. (2006), \u201cThe filtration model and simulation for high dynamic testing system\u201d, Advances in Systems Science and Applications, Vol. 2, pp. 248\u201054."},{"key":"key2022021220114973800_frd7","unstructured":"Zhu, C., Rao, Y. and Shao, X. (2006), \u201cComputation of reducts for dominance\u2010based rough set approach\u201d, Advances in Systems Science and Applications, Vol. 2, pp. 326\u201033."}],"container-title":["Kybernetes"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/www.emeraldinsight.com\/doi\/full-xml\/10.1108\/03684920910944056","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/www.emerald.com\/insight\/content\/doi\/10.1108\/03684920910944056\/full\/xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/www.emerald.com\/insight\/content\/doi\/10.1108\/03684920910944056\/full\/html","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,24]],"date-time":"2025-07-24T23:53:32Z","timestamp":1753401212000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.emerald.com\/k\/article\/38\/3-4\/362-368\/451372"}},"subtitle":[],"editor":[{"given":"Mian\u2010yun","family":"Chen","sequence":"first","affiliation":[]}],"short-title":[],"issued":{"date-parts":[[2009,4,10]]},"references-count":7,"journal-issue":{"issue":"3\/4","published-print":{"date-parts":[[2009,4,10]]}},"alternative-id":["10.1108\/03684920910944056"],"URL":"https:\/\/doi.org\/10.1108\/03684920910944056","relation":{},"ISSN":["0368-492X"],"issn-type":[{"type":"print","value":"0368-492X"}],"subject":[],"published":{"date-parts":[[2009,4,10]]}}}