{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T17:14:36Z","timestamp":1775582076873,"version":"3.50.1"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,10]],"date-time":"2023-05-10T00:00:00Z","timestamp":1683676800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,10]],"date-time":"2023-05-10T00:00:00Z","timestamp":1683676800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,10]]},"DOI":"10.1109\/3dic57175.2023.10154929","type":"proceedings-article","created":{"date-parts":[[2023,6,26]],"date-time":"2023-06-26T18:07:49Z","timestamp":1687802869000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Measurement Point Selection Algorithms for Testing Power TSVs"],"prefix":"10.1109","author":[{"given":"Koutaro","family":"Hachiya","sequence":"first","affiliation":[{"name":"Graduate School of Environmental Informatics, Teikyo Heisei University,Tokyo,Japan"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SaPIW.2019.8781656"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2017.7939646"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/3DIC48104.2019.9058881"},{"key":"ref5","first-page":"1146162022","author":"climbing","year":"2023","journal-title":"Wikipedia"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2022.3202221"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1115\/1.4052069"}],"event":{"name":"2023 IEEE International 3D Systems Integration Conference (3DIC)","location":"Cork, Ireland","start":{"date-parts":[[2023,5,10]]},"end":{"date-parts":[[2023,5,12]]}},"container-title":["2023 IEEE International 3D Systems Integration Conference (3DIC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10154896\/10154899\/10154929.pdf?arnumber=10154929","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,17]],"date-time":"2023-07-17T17:31:32Z","timestamp":1689615092000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10154929\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,10]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/3dic57175.2023.10154929","relation":{},"subject":[],"published":{"date-parts":[[2023,5,10]]}}}