{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:25:14Z","timestamp":1749205514982},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[1991,1,1]],"date-time":"1991-01-01T00:00:00Z","timestamp":662688000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[1991]]},"DOI":"10.1109\/43.85740","type":"journal-article","created":{"date-parts":[[2002,8,24]],"date-time":"2002-08-24T17:57:42Z","timestamp":1030211862000},"page":"1036-1048","source":"Crossref","is-referenced-by-count":43,"title":["Design of robustly testable combinational logic circuits"],"prefix":"10.1109","volume":"10","author":[{"given":"S.","family":"Kundu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.M.","family":"Reddy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.K.","family":"Jha","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","author":"wagner","year":"1986","journal-title":"Delay Testing of Digital Circuits Using Pseudorandom Input Sequences"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/12.2166"},{"key":"ref12","first-page":"694","article-title":"On delay fault testing in logic circuits","volume":"cad 6","author":"lin","year":"1987","journal-title":"IEEE Trans Computer-Aided Design"},{"key":"ref13","first-page":"284","article-title":"An automatic test pattern generator for detection of path delay faults","author":"reddy","year":"1987","journal-title":"Proc Int Conf Computer-Aided Design"},{"key":"ref14","first-page":"418","article-title":"Efficient test coverage determination for delay faults","author":"carter","year":"1987","journal-title":"Proc Int Test Conf"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1972.223475"},{"key":"ref16","first-page":"1027","article-title":"Robust and non-robust tests for path delay faults in a combinational circuit","author":"park","year":"1987","journal-title":"Proc Int Test Conf"},{"key":"ref17","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4613-2821-6","author":"brayton","year":"1984","journal-title":"Logic Minimization Algorithms for VLSI Synthesis"},{"key":"ref18","author":"kohavi","year":"1978","journal-title":"Switching and Finite Automata Theory"},{"key":"ref19","author":"muroga","year":"1982","journal-title":"VLSI System Design"},{"key":"ref28","first-page":"21","article-title":"ALPS: A generation of static CMOS layout from boolean expressions","author":"serlet","year":"1991","journal-title":"Proc MIT Conf Advanced Research in VLSI"},{"key":"ref4","first-page":"44","article-title":"Robust tests for stuck-open faults in CMOS combinational logic circuits","author":"reddy","year":"1984","journal-title":"Proc Annu Symp Fault-Tolerant Comput"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1990.89391"},{"key":"ref3","first-page":"536","article-title":"Functional-level test generation for stuck-open faults in CMOS VLSI","author":"el-ziq","year":"1981","journal-title":"Proc Int Test Conf"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1986.1676825"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-009-1417-9_4"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"264","DOI":"10.1109\/TCAD.1985.1270122","article-title":"Design of testable CMOS logic circuits under arbitrary delays","author":"jha","year":"1985","journal-title":"IEEE Trans Computer-Aided Design"},{"key":"ref7","article-title":"Testable CMOS logic under dynamic behavior","author":"jha","year":"1984","journal-title":"Proc Int Conf Computer-Aided Design"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675614"},{"key":"ref9","first-page":"342","article-title":"Model for delay faults based upon paths","author":"smith","year":"1985","journal-title":"Proc Int Test Conf"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1978.tb02106.x"},{"key":"ref20","article-title":"Neutral netlist of ten combinational benchmark circuits and target translator in FORTRAN","author":"brglez","year":"1985","journal-title":"Proc IEEE Int Symp on Circuits and Systems"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/12.2186"},{"key":"ref21","author":"kundu","year":"1988","journal-title":"Design of Testable CMOS circuits and Codes for TSC Systems"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1972.223428"},{"key":"ref23","first-page":"752","article-title":"On the indistinguishability of faults in digital systems","author":"schertz","year":"1968","journal-title":"Proc 1st Annual Allerton Conf Circuit Syst Theory"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1984.1585845"},{"key":"ref25","first-page":"248","article-title":"Testing stuck-on faults in CMOS integrated circuits","author":"malaiya","year":"1984","journal-title":"Proc Int Conf on Computer-Aided Design"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx1\/43\/2803\/00085740.pdf?arnumber=85740","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:07:35Z","timestamp":1638216455000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/85740\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1991]]},"references-count":28,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/43.85740","relation":{},"ISSN":["0278-0070"],"issn-type":[{"value":"0278-0070","type":"print"}],"subject":[],"published":{"date-parts":[[1991]]}}}