{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T10:51:27Z","timestamp":1730199087633,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,11,7]],"date-time":"2021-11-07T00:00:00Z","timestamp":1636243200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,11,7]],"date-time":"2021-11-07T00:00:00Z","timestamp":1636243200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,11,7]],"date-time":"2021-11-07T00:00:00Z","timestamp":1636243200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,11,7]]},"DOI":"10.1109\/a-sscc53895.2021.9634727","type":"proceedings-article","created":{"date-parts":[[2021,12,10]],"date-time":"2021-12-10T15:45:05Z","timestamp":1639151105000},"page":"1-3","source":"Crossref","is-referenced-by-count":2,"title":["A process scalable voltage-reference-free temperature sensor utilizing MOSFET threshold voltage variation"],"prefix":"10.1109","author":[{"given":"Shogo","family":"Harada","sequence":"first","affiliation":[]},{"given":"Mahfuzul","family":"Islam","sequence":"additional","affiliation":[]},{"given":"Takashi","family":"Hisakado","sequence":"additional","affiliation":[]},{"given":"Osami","family":"Wada","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3042825"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2891718"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2014.7008920"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2952855"},{"key":"ref7","first-page":"156","article-title":"Analyses of 5? Vth fluctuation in 65 nm-MOSFETs using Takeuchi plot","author":"tsunomura","year":"2008","journal-title":"Symposium on VLSI Technology"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2325574"},{"key":"ref1","first-page":"2805","article-title":"A CMOS smart temperature sensor with a 3? inaccuracy of ± 0.1°C from -55°C to 125°C","volume":"40","author":"pertij","year":"2005","journal-title":"IEEE JSSC"}],"event":{"name":"2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)","start":{"date-parts":[[2021,11,7]]},"location":"Busan, Korea, Republic of","end":{"date-parts":[[2021,11,10]]}},"container-title":["2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9634699\/9634177\/09634727.pdf?arnumber=9634727","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T12:54:27Z","timestamp":1652187267000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9634727\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,11,7]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/a-sscc53895.2021.9634727","relation":{},"subject":[],"published":{"date-parts":[[2021,11,7]]}}}