{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T09:15:58Z","timestamp":1773825358537,"version":"3.50.1"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,11,5]],"date-time":"2023-11-05T00:00:00Z","timestamp":1699142400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,11,5]],"date-time":"2023-11-05T00:00:00Z","timestamp":1699142400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,11,5]]},"DOI":"10.1109\/a-sscc58667.2023.10348012","type":"proceedings-article","created":{"date-parts":[[2023,12,18]],"date-time":"2023-12-18T14:25:44Z","timestamp":1702909544000},"page":"1-3","source":"Crossref","is-referenced-by-count":2,"title":["A Wide Frequency Range, Small Area and Low Supply Memory Interface PLL Using a Process and Temperature Variation Aware Current Reference in 3 nm Gate-All Around CMOS"],"prefix":"10.1109","author":[{"given":"Kyungmin","family":"Lee","sequence":"first","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}]},{"given":"Jaehong","family":"Jung","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}]},{"given":"Gyusik","family":"Kim","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}]},{"given":"Joomyoung","family":"Kim","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}]},{"given":"Seungjin","family":"Kim","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}]},{"given":"Seunghyun","family":"Oh","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}]},{"given":"Sung Min","family":"Park","sequence":"additional","affiliation":[{"name":"Ewha Womans University,Seoul,Korea"}]},{"given":"Jongwoo","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Electronics,Hwaseong,Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2850937"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC47793.2019.9056931"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2015.7063028"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/4.997845"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC48613.2020.9336144"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2019.8778061"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2016.7418038"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2784319"}],"event":{"name":"2023 IEEE Asian Solid-State Circuits Conference (A-SSCC)","location":"Haikou, China","start":{"date-parts":[[2023,11,5]]},"end":{"date-parts":[[2023,11,8]]}},"container-title":["2023 IEEE Asian Solid-State Circuits Conference (A-SSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10347557\/10347908\/10348012.pdf?arnumber=10348012","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T17:29:59Z","timestamp":1761672599000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10348012\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/a-sscc58667.2023.10348012","relation":{},"subject":[],"published":{"date-parts":[[2023,11,5]]}}}