{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T18:39:18Z","timestamp":1725475158292},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,6]]},"DOI":"10.1109\/acc.2008.4586851","type":"proceedings-article","created":{"date-parts":[[2008,8,12]],"date-time":"2008-08-12T10:28:20Z","timestamp":1218536900000},"page":"2401-2408","source":"Crossref","is-referenced-by-count":2,"title":["Error Tolerant Arrangements of sensors for sampling fields"],"prefix":"10.1109","author":[{"given":"Ajay","family":"Deshpande","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sanjay E.","family":"Sarma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"article-title":"6.867 machine learning class notes","year":"2007","author":"jaakkola","key":"17"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/IPSN.2006.244057"},{"journal-title":"Matrix Computations","year":"1996","author":"golub","key":"16"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1145\/1236360.1236397"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/INFCOM.2007.290"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ROBOT.2007.364041"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2006.887295"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.1998.659497"},{"journal-title":"Linear Estimation","year":"2000","author":"kailath","key":"2"},{"journal-title":"Optimization by vector space methods","year":"1969","author":"luenberger","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1145\/1102351.1102385"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1016\/0024-3795(93)90275-S"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.2307\/2152989"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.2307\/1990760"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1956.1086325"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/972374.972396"},{"year":"0","key":"8"}],"event":{"name":"2008 American Control Conference (ACC '08)","start":{"date-parts":[[2008,6,11]]},"location":"Seattle, WA","end":{"date-parts":[[2008,6,13]]}},"container-title":["2008 American Control Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4547420\/4586444\/04586851.pdf?arnumber=4586851","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T11:05:05Z","timestamp":1489662305000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4586851\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,6]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/acc.2008.4586851","relation":{},"subject":[],"published":{"date-parts":[[2008,6]]}}}