{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T08:39:22Z","timestamp":1725698362938},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,6]]},"DOI":"10.1109\/acc.2008.4586917","type":"proceedings-article","created":{"date-parts":[[2008,8,12]],"date-time":"2008-08-12T10:28:20Z","timestamp":1218536900000},"page":"2798-2803","source":"Crossref","is-referenced-by-count":4,"title":["Parity space fault detection based on irregularly sampled data"],"prefix":"10.1109","author":[{"given":"Iman","family":"Izadi","sequence":"first","affiliation":[]},{"given":"Sirish L.","family":"Shah","sequence":"additional","affiliation":[]},{"family":"Tongwen Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/9.763221"},{"journal-title":"Fault-Diagnosis Systems An Introduction from Fault Detection to Fault Tolerance","year":"2006","author":"isermann","key":"2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2005.11.010"},{"key":"1","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4615-5149-2","author":"chen","year":"1999","journal-title":"Robust Model-Based Fault Diagnosis for Dynamic Systems"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2001.946289"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2005.03.028"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-3037-6"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(02)00009-4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1016\/S0967-0661(99)00005-2"},{"key":"8","article-title":"a direct approach to fault detection in non-uniformly sampled systems","author":"izadi","year":"2008","journal-title":"IFAC World Congress"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2007.05.009"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1984.1103593"}],"event":{"name":"2008 American Control Conference (ACC '08)","start":{"date-parts":[[2008,6,11]]},"location":"Seattle, WA","end":{"date-parts":[[2008,6,13]]}},"container-title":["2008 American Control Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4547420\/4586444\/04586917.pdf?arnumber=4586917","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T06:49:07Z","timestamp":1497768547000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4586917\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,6]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/acc.2008.4586917","relation":{},"subject":[],"published":{"date-parts":[[2008,6]]}}}