{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,17]],"date-time":"2025-09-17T15:39:36Z","timestamp":1758123576719,"version":"3.28.0"},"reference-count":51,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,7]]},"DOI":"10.1109\/acc.2015.7170847","type":"proceedings-article","created":{"date-parts":[[2015,7,30]],"date-time":"2015-07-30T17:26:01Z","timestamp":1438277161000},"page":"892-899","source":"Crossref","is-referenced-by-count":4,"title":["Sensor fault detection and isolation using phase space reconstruction"],"prefix":"10.1109","author":[{"given":"Cheng-Ken","family":"Yang","sequence":"first","affiliation":[]},{"given":"Alireza","family":"Alemi","sequence":"additional","affiliation":[]},{"given":"Reza","family":"Langari","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2007.2124"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2006.1837"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1115\/1.1456908"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1997.9.7.1493"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1162\/089976699300016728"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1111\/1467-9868.00196"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-005-9007-7"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2004.02.017"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1023\/B:NODY.0000045546.02766.ad"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1115\/1.1456907"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1021\/ie049081o"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1023\/A:1007981322574"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690370209"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(02)00161-8"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(02)00161-8"},{"key":"ref20","doi-asserted-by":"crossref","DOI":"10.1002\/0471725331","author":"jackson","year":"1991","journal-title":"A User's Guide to Principal Components"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2011.02.015"},{"key":"ref21","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-1904-8","author":"jolliffe","year":"1986","journal-title":"Principal Component Analysis"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2012.07.014"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(00)00022-6"},{"key":"ref26","first-page":"6","article-title":"Instrument surveillance and calibration verification through plant wide monitoring using autoassociative neural networks","author":"wrest","year":"1996","journal-title":"proceedings of The 1996 American Nuclear Society International Topical Meeting on Nuclear Plant Instrumentation Control and Human Machine Interface Technologies"},{"journal-title":"Use of Auto Associate Neural Networks for Sensor Diagnostics","year":"2003","author":"najafi","key":"ref25"},{"journal-title":"Laboratory Setup Three Tank System","year":"1996","key":"ref50"},{"key":"ref51","article-title":"Benchmark definition file","author":"koscielny","year":"2002","journal-title":"Warsaw University of Technology"},{"key":"ref10","article-title":"Safety and Hazard Investigation Board","author":"chemical","year":"2007","journal-title":"Refinery Fire and Explosion and Fire BP Texas City March 23 2005 Final Ivestigation Report Report No 2005-04-I-TX"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(76)90041-8"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/BF01053745"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1984.1103593"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0967-0661(97)00047-6"},{"journal-title":"Fault Detection and Diagnosis in Engineering Systems","year":"1998","author":"gertler","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2007.07.006"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2009.07.005"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690470711"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2012.2208638"},{"key":"ref19","article-title":"A survey of dimension reduction techniques","author":"fodor","year":"2002","journal-title":"US Department of Energy"},{"journal-title":"Model-Based Fault Diagnosis Techniques","year":"2008","author":"ding","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(02)00162-X"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/S0967-0661(97)00053-1"},{"key":"ref5","first-page":"481","article-title":"Fault detection of the Tennessee Eastman Process using improved PCA and neural classifier","volume":"9","author":"nashalji","year":"2009","journal-title":"International Journal of Electrical & Computer Sciences"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2009.2026285"},{"key":"ref7","first-page":"959","article-title":"Remarks on terminology in the field of supervision, fault detection and diagnosis","author":"schrick","year":"1997","journal-title":"Proc IFAC Symp Fault Detection Supervision Safety for Techn Process (SAFEPROCESS)"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/9.780416"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/aic.11320"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4020-9143-8_1"},{"key":"ref45","volume":"i","author":"kay","year":"1993","journal-title":"Fundamentals of Statistical Signal Processing"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.2514\/1.15012"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.59.845"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/BFb0091924"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.2307\/1968482"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.45.3403"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.33.1134"}],"event":{"name":"2015 American Control Conference (ACC)","start":{"date-parts":[[2015,7,1]]},"location":"Chicago, IL, USA","end":{"date-parts":[[2015,7,3]]}},"container-title":["2015 American Control Conference (ACC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7160954\/7170700\/07170847.pdf?arnumber=7170847","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T12:44:34Z","timestamp":1498221874000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7170847\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,7]]},"references-count":51,"URL":"https:\/\/doi.org\/10.1109\/acc.2015.7170847","relation":{},"subject":[],"published":{"date-parts":[[2015,7]]}}}