{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,18]],"date-time":"2025-10-18T23:08:43Z","timestamp":1760828923114,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,7]]},"DOI":"10.1109\/acc.2015.7170858","type":"proceedings-article","created":{"date-parts":[[2015,7,30]],"date-time":"2015-07-30T21:26:01Z","timestamp":1438291561000},"page":"962-967","source":"Crossref","is-referenced-by-count":5,"title":["Two new normalized EWMA-based indices for control loop performance assessment"],"prefix":"10.1109","author":[{"given":"Timothy I.","family":"Salsbury","sequence":"first","affiliation":[]},{"given":"Carlos F.","family":"Alcala","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Time Series Analysis by Higher Order Crossings","year":"1994","author":"kedem","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0967-0661(99)00100-8"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(99)00031-1"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1956.1056822"},{"journal-title":"Condition Monitoring of Control Loops","year":"2000","author":"horch","key":"ref11"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/aic.10104"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-84628-624-7"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"441","DOI":"10.1016\/j.conengprac.2005.11.005","article-title":"An overview of control performance assessment technology and industrial applications","volume":"14","author":"mohieddine","year":"2006","journal-title":"Control Eng Practice"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/cjce.5450700620"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/cjce.5450670519"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1142\/p277"}],"event":{"name":"2015 American Control Conference (ACC)","start":{"date-parts":[[2015,7,1]]},"location":"Chicago, IL, USA","end":{"date-parts":[[2015,7,3]]}},"container-title":["2015 American Control Conference (ACC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7160954\/7170700\/07170858.pdf?arnumber=7170858","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T16:44:25Z","timestamp":1498236265000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7170858\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,7]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/acc.2015.7170858","relation":{},"subject":[],"published":{"date-parts":[[2015,7]]}}}