{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T02:59:19Z","timestamp":1772333959785,"version":"3.50.1"},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,7]]},"DOI":"10.1109\/acc.2015.7171873","type":"proceedings-article","created":{"date-parts":[[2015,7,30]],"date-time":"2015-07-30T17:26:01Z","timestamp":1438277161000},"page":"3503-3508","source":"Crossref","is-referenced-by-count":4,"title":["A fast image reconstruction algorithm for compressed sensing-based atomic force microscopy"],"prefix":"10.1109","author":[{"family":"Yufan Luo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sean B.","family":"Andersson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s00424-007-0406-0"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/18\/4\/044030"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2011.6144587"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2012.6315406"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/23\/3\/008"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914731"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/cpa.20124"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-7011-4"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/18.720544"},{"key":"ref19","author":"jian","year":"0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/asjc.90"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.1150069"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.1499533"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.1850651"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.3600558"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/15\/1\/021"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1146\/annurev-biophys-083012-130324"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.56.930"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.4725525"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2014.6858710"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2006.881969"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1963.10500830"},{"key":"ref23","author":"jain","year":"1989","journal-title":"Fundamentals of Digital Image Processing"}],"event":{"name":"2015 American Control Conference (ACC)","location":"Chicago, IL, USA","start":{"date-parts":[[2015,7,1]]},"end":{"date-parts":[[2015,7,3]]}},"container-title":["2015 American Control Conference (ACC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7160954\/7170700\/07171873.pdf?arnumber=7171873","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T19:33:35Z","timestamp":1490384015000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7171873\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,7]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/acc.2015.7171873","relation":{},"subject":[],"published":{"date-parts":[[2015,7]]}}}