{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T22:10:00Z","timestamp":1729635000917,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,7]]},"DOI":"10.1109\/acc.2016.7526838","type":"proceedings-article","created":{"date-parts":[[2016,8,4]],"date-time":"2016-08-04T20:29:05Z","timestamp":1470342545000},"page":"7384-7389","source":"Crossref","is-referenced-by-count":3,"title":["A specimen-tracking controller for the transverse dynamic force microscope in non-contact mode"],"prefix":"10.1109","author":[{"given":"T.","family":"Hatano","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.G.","family":"Khan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Nguyen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Herrmann","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Edwards","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.C.","family":"Burgess","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Miles","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"A current cycle feedback iterative learning control approach for AFM imaging. IEEE, Transactions on N anotec-nology","volume":"8","author":"wu","year":"2009"},{"key":"ref11","article-title":"High-speed atomic force microscope by surface topography observer","volume":"51","author":"shiraishi","year":"2012","journal-title":"Jap J Appl Pys"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4808211"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/19\/38\/384002"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/1438-5171(200206)3:2\/3<105::AID-SIMO105>3.0.CO;2-#"},{"key":"ref15","first-page":"101","article-title":"Investigation of nano-confined liquids on muscovite by transverse dynamic force microscopy (TDFM). GeoActa","volume":"2","author":"antognozzi","year":"2003"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1126\/science.1233936"},{"key":"ref17","article-title":"Estimation of the shear force in transverse dynamic force microscopy using a sliding mode observer. AIP Advances","volume":"5","author":"nguyen","year":"2015"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-3991(00)00087-5"},{"journal-title":"NuVOC Ultra-soft Probes","article-title":"Nu Nano Ltd, Bristol","year":"2015","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.1865812"},{"key":"ref3","article-title":"Optimizing atomic resolution of force microscopy in ambient conditions. Physical Review B","volume":"87","author":"wastl","year":"2013"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2007.4282300"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/22\/9\/095707"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2012.01.007"},{"key":"ref7","first-page":"253","article-title":"Fast contact-mode atomic force microscopy on biological specimen by model-based control. Ultramicroscopy","volume":"100","author":"schitter","year":"2003"},{"key":"ref2","first-page":"949","article-title":"Advances in atomic force microscopy. Reviews of Modern Physics","volume":"75","author":"giessibl","year":"2003"},{"key":"ref1","first-page":"930","article-title":"Atomic force microscope. Physical Review Letters","volume":"56","author":"binnig","year":"1986"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.66.115409"},{"journal-title":"Physik Instrumente","year":"2015","key":"ref20"},{"journal-title":"National Instruments","year":"2003","key":"ref22"},{"journal-title":"Physik Instrumente","year":"2015","key":"ref21"},{"journal-title":"NI 5781R User Guide and Specifications","year":"2010","key":"ref24"},{"journal-title":"Piezo Power Amplifier for AFM (Atomic force microscopy)","year":"2008","key":"ref23"}],"event":{"name":"2016 American Control Conference (ACC)","start":{"date-parts":[[2016,7,6]]},"location":"Boston, MA, USA","end":{"date-parts":[[2016,7,8]]}},"container-title":["2016 American Control Conference (ACC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7518121\/7524873\/07526838.pdf?arnumber=7526838","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,30]],"date-time":"2016-09-30T01:34:42Z","timestamp":1475199282000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7526838\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,7]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/acc.2016.7526838","relation":{},"subject":[],"published":{"date-parts":[[2016,7]]}}}