{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T15:10:13Z","timestamp":1773760213484,"version":"3.50.1"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2017,1,1]],"date-time":"2017-01-01T00:00:00Z","timestamp":1483228800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/3.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100007350","name":"CONACYT Scholarship","doi-asserted-by":"publisher","award":["401359"],"award-info":[{"award-number":["401359"]}],"id":[{"id":"10.13039\/501100007350","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100006054","name":"Universidad de Guanajuato, DAIP","doi-asserted-by":"publisher","award":["733\/2016"],"award-info":[{"award-number":["733\/2016"]}],"id":[{"id":"10.13039\/501100006054","id-type":"DOI","asserted-by":"publisher"}]},{"name":"CEI Triangular-E3, Universidades de Burgos, Le\u00f3n y Valladolid"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2017]]},"DOI":"10.1109\/access.2017.2732726","type":"journal-article","created":{"date-parts":[[2017,7,27]],"date-time":"2017-07-27T18:08:34Z","timestamp":1501178914000},"page":"14259-14274","source":"Crossref","is-referenced-by-count":32,"title":["FPGA-Based Smart Sensor for Detection and Classification of Power Quality Disturbances Using Higher Order Statistics"],"prefix":"10.1109","volume":"5","author":[{"given":"Gerardo De J.","family":"Martinez-Figueroa","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6153-9438","authenticated-orcid":false,"given":"Daniel","family":"Morinigo-Sotelo","sequence":"additional","affiliation":[]},{"given":"Angel Luis","family":"Zorita-Lamadrid","sequence":"additional","affiliation":[]},{"given":"Luis","family":"Morales-Velazquez","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3192-5332","authenticated-orcid":false,"given":"Rene De J.","family":"Romero-Troncoso","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2006.12.011"},{"key":"ref38","year":"2016","journal-title":"Cyclone IV Device Handbook"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3390\/pharmaceutics2020182"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/algor2030973"},{"key":"ref31","author":"haykin","year":"2009","journal-title":"Neural Networks and Learning Machines"},{"key":"ref30","year":"2011","journal-title":"American National Standard for Electric Power Systems and Equipment-Voltage Ratings (60 Hertz)"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2008.07.030"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2011.07.018"},{"key":"ref35","year":"2008","journal-title":"User Manual of Fluke 435 Three Phase Power Quality Analyzer"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ReConFig.2010.31"},{"key":"ref10","first-page":"1","article-title":"Review of power quality monitoring systems","author":"ahmad","year":"2015","journal-title":"Proc Int Conf Ind Eng Oper Manage (IEOM)"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.928111"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2015.07.068"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2469279"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/s6060557"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/0924-4247(94)85010-0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/s8117410"},{"key":"ref16","first-page":"5031","article-title":"Study of smart sensors and their applications","volume":"3","author":"chaudhari","year":"2014","journal-title":"Int J Adv Res Comput Commun Eng"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2011.2123908"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/s120912235"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2008.4547165"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/EPSCICON.2014.6887497"},{"key":"ref4","year":"1994","journal-title":"Voltage Characteristics of Electricity Supplied by Public Distribution Systems"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2012.03.036"},{"key":"ref3","year":"2003","journal-title":"Power Quality Measurement Methods Testing and Measurement Techniques"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2004.1372855"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.02.031"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2010.0466"},{"key":"ref8","first-page":"746","article-title":"Voltage drop repercussions in industrial processes due to the interaction of several machines in a manufacturing cell","volume":"72","author":"granados-lieberman","year":"2013","journal-title":"J Sci Ind Res"},{"key":"ref7","author":"sankaran","year":"2002","journal-title":"Power Quality"},{"key":"ref2","year":"2009","journal-title":"IEEE Recommended practice for monitoring electric power quality"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.2014.6842845"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2014.08.070"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2011055"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2014.2301716"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/s130505507"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2012.09.037"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2258761"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1080\/15325000903273387"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2013.01.011"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2486379"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2013.02.002"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2248335"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/5.75086"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/7859429\/07994604.pdf?arnumber=7994604","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:26:11Z","timestamp":1642004771000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7994604\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/access.2017.2732726","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017]]}}}