{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,18]],"date-time":"2026-07-18T02:35:54Z","timestamp":1784342154095,"version":"3.55.0"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"funder":[{"DOI":"10.13039\/501100002383","name":"Deanship of Scientific Research at King Saud University","doi-asserted-by":"publisher","award":["RG-1436-039"],"award-info":[{"award-number":["RG-1436-039"]}],"id":[{"id":"10.13039\/501100002383","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2018]]},"DOI":"10.1109\/access.2017.2785445","type":"journal-article","created":{"date-parts":[[2017,12,27]],"date-time":"2017-12-27T19:30:05Z","timestamp":1514403005000},"page":"2844-2858","source":"Crossref","is-referenced-by-count":67,"title":["A Framework for Software Defect Prediction and Metric Selection"],"prefix":"10.1109","volume":"6","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7848-0508","authenticated-orcid":false,"given":"Shamsul","family":"Huda","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sultan","family":"Alyahya","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Md","family":"Mohsin Ali","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0712-9133","authenticated-orcid":false,"given":"Shafiq","family":"Ahmad","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jemal","family":"Abawajy","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hmood","family":"Al-Dossari","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"John","family":"Yearwood","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2010.90"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2008.04.008"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2014.10.032"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2014.10.025"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.3182\/20131216-3-IN-2044.00026"},{"key":"ref36","year":"2016","journal-title":"The Tera-Promise Defect Repository"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/3477.990877"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2014.02.032"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/BF00116251"},{"key":"ref11","author":"kr\u00f6se","year":"1993","journal-title":"An Introduction to Neural Networks"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2014.07.005"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"504","DOI":"10.1016\/j.asoc.2014.11.023","article-title":"A systematic review of machine learning techniques for software fault prediction","volume":"27","author":"malhotra","year":"2015","journal-title":"Appl Soft Comput"},{"key":"ref14","first-page":"127","article-title":"Evaluating the impact of software metrics on defects prediction. Part 2","volume":"22","author":"asad","year":"2014","journal-title":"Computer Science Journal of Moldova"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2012.02.171"},{"key":"ref16","first-page":"24","article-title":"Interpreting the out-of-control signals of multivariate control charts employing neural networks","volume":"4","author":"aparisi","year":"2010","journal-title":"Int J Comput Elect Autom Control Inf Eng"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0004-3702(97)00043-X"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2010.62"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.256941"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2014.10.017"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/NAFIPS.2007.383813"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2014.11.006"},{"key":"ref3","author":"ainapure","year":"2014","journal-title":"Software Testing and Quality Assurance"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2008.12.001"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2009.5070510"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.03.001"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1098\/rstl.1763.0053"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0950-5849(98)00098-6"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2015.04.045"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511801389"},{"key":"ref1","year":"2016","journal-title":"Book Gartner Says Worldwide It Spending on Pace to Reach $3 8 Trillion in 2014"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2013.02.009"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/16843703.2012.11673302"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2009.5306304"},{"key":"ref24","author":"halstead","year":"1977","journal-title":"Elements of Software Science"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/32.553637"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/0164-1212(93)90077-B"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/32.295895"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8274985\/08240899.pdf?arnumber=8240899","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T03:00:18Z","timestamp":1633921218000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8240899\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/access.2017.2785445","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018]]}}}