{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T05:50:18Z","timestamp":1780638618397,"version":"3.54.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61473014"],"award-info":[{"award-number":["61473014"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61471385"],"award-info":[{"award-number":["61471385"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2018]]},"DOI":"10.1109\/access.2018.2789518","type":"journal-article","created":{"date-parts":[[2018,1,4]],"date-time":"2018-01-04T22:51:52Z","timestamp":1515106312000},"page":"4440-4451","source":"Crossref","is-referenced-by-count":25,"title":["Mechanism Equivalence in Designing Optimum Step-Stress Accelerated Degradation Test Plan Under Wiener Process"],"prefix":"10.1109","volume":"6","author":[{"given":"Han","family":"Wang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yu","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0913-9012","authenticated-orcid":false,"given":"Xiaobing","family":"Ma","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.17531\/ein.2017.2.19"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ARMS.1992.187820"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2318725"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.polymdegradstab.2004.06.010"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.03.010"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2008.07.009"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2190"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2049"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2014.09.003"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2017.2666199"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2299155"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1023\/B:LIDA.0000036389.14073.dd"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2033734"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2013.830074"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2013.879077"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.05.018"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2012.715838"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(01)00123-5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.06.147"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2015.1033109"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1998.10485191"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/nav.21516"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.863811"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2000.11979997"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2284733"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2008.12.007"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2010.11.018"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.02.005"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2194190"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.06.002"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1994.10485803"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1214\/088342306000000321"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1002\/nav.21551"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2004.1285462"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/qre.518"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.2307\/2287460"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8274985\/08246488.pdf?arnumber=8246488","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:14:34Z","timestamp":1642004074000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8246488\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/access.2018.2789518","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018]]}}}