{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T09:23:12Z","timestamp":1760606592933,"version":"3.37.3"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2018]]},"DOI":"10.1109\/access.2018.2789931","type":"journal-article","created":{"date-parts":[[2018,1,5]],"date-time":"2018-01-05T19:43:13Z","timestamp":1515181393000},"page":"5151-5161","source":"Crossref","is-referenced-by-count":18,"title":["Multi-State Reliability Assessment Method Based on the MDD-GO Model"],"prefix":"10.1109","volume":"6","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3665-700X","authenticated-orcid":false,"given":"Yi","family":"Ren","sequence":"first","affiliation":[]},{"given":"Chenchen","family":"Zeng","sequence":"additional","affiliation":[]},{"given":"Dongming","family":"Fan","sequence":"additional","affiliation":[]},{"given":"Linlin","family":"Liu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2454-7839","authenticated-orcid":false,"given":"Qiang","family":"Feng","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","first-page":"1","article-title":"Principle and application of GO methodology","author":"shen","year":"2014","journal-title":"A System Reliability Analysis Method"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.01.017"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1986.1676819"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675141"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-017-1336-0"},{"article-title":"GO methodology: Overview","year":"1978","author":"corporation","key":"ref30"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-2622-0"},{"key":"ref36","doi-asserted-by":"crossref","DOI":"10.1142\/5221","author":"lisnianski","year":"2003","journal-title":"Multi-State System Reliability Assessment Optimization and Applications"},{"key":"ref35","first-page":"581","article-title":"Fundamental concepts and relations for reliability analysis of multi-state systems and fault tree analysis","author":"murchland","year":"1975","journal-title":"Proc Theor Appl Aspects Syst"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1243\/1748006XJRR47"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"57","DOI":"10.1016\/S1474-6670(17)36470-4","article-title":"Reliability modelling with dynamic Bayesian networks","volume":"36","author":"weber","year":"2003","journal-title":"IFAC Proc Volumes"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1080\/07408170802322655"},{"key":"ref11","first-page":"451","article-title":"A new Bayesian network approach to solve dynamic fault tree","author":"boudali","year":"2005","journal-title":"Proc Rel Maintainability Symp"},{"key":"ref12","first-page":"212","article-title":"Algorithm based on Bayesian networks for GO methodology","volume":"37","author":"liu","year":"2015","journal-title":"Syst Eng Electron"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.nucengdes.2016.06.010"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2005.11.037"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.09.019"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"472","DOI":"10.1016\/j.ress.2015.06.012","article-title":"An efficient algorithm for the multi-state two separate minimal paths reliability problem with budget constraint","volume":"142","author":"majid","year":"2015","journal-title":"Rel Eng Syst Safety"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1252856"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2034946"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISMVL.1993.289589"},{"key":"ref28","first-page":"1995","article-title":"Representation and estimation of multi-state system reliability by decision diagrams","author":"zaitseva","year":"2009","journal-title":"Proc Joint ESREL SRA-Europe Conf Safety Rel Risk Anal Theory Methods Appl"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DT.2013.6566304"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jal.2013.05.005"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CHUSER.2011.6163711"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1287\/moor.3.4.275"},{"key":"ref29","first-page":"825","article-title":"Use of the GO methodology to directly generate minimal cut sets","author":"williams","year":"1977","journal-title":"Proc Int Conf Nucl Syst Rel Eng Risk Assessment"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0029-5493(97)00038-1"},{"key":"ref8","first-page":"5035","article-title":"A new quantification algorithm with probability matrix in the GO methodology","volume":"11","author":"xiuhong","year":"2014","journal-title":"J Inf Comput Sci"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(01)00035-7"},{"key":"ref2","first-page":"125","article-title":"Go methodology: Overview manual","volume":"1","author":"chu","year":"1983","journal-title":"Electr Power Res Inst"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MEC.2013.6885060"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(99)00071-X"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2007.70244"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1201\/b17399-37"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISMVL.2014.37"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-63423-4_14"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(02)00046-7"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DT.2017.8024299"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2404891"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.09.006"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8274985\/08247179.pdf?arnumber=8247179","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:14:34Z","timestamp":1642004074000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8247179\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/access.2018.2789931","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2018]]}}}