{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T10:53:25Z","timestamp":1761562405894,"version":"3.37.3"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2018]]},"DOI":"10.1109\/access.2018.2862162","type":"journal-article","created":{"date-parts":[[2018,8,3]],"date-time":"2018-08-03T20:03:16Z","timestamp":1533326596000},"page":"43079-43087","source":"Crossref","is-referenced-by-count":4,"title":["A Simple Test to Check the Inherent-Stability Proviso on Field-Effect Transistors"],"prefix":"10.1109","volume":"6","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6609-2452","authenticated-orcid":false,"given":"Sergio","family":"Colangeli","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7503-0373","authenticated-orcid":false,"given":"Rocco","family":"Giofre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8027-2449","authenticated-orcid":false,"given":"Walter","family":"Ciccognani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4668-7461","authenticated-orcid":false,"given":"Ernesto","family":"Limiti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"363","DOI":"10.1109\/TMTT.2009.2038660","article-title":"Unconditional stability boundaries of a three-port network","volume":"58","author":"kuo","year":"2010","journal-title":"IEEE Trans Microw Theory Techn"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/ip-map:20045035"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1987.1133707"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2642401"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2017.8058994"},{"key":"ref15","article-title":"Optimization-based approach for scalable small-signal and noise model extraction of GaN-on-SiC HEMTs","author":"colangeli","year":"2015","journal-title":"International Journal of Numerical Modelling Electronic Networks Devices and Fields"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/22.3650"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2015.2447542"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2010.2041576"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/22.769324"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/GAAS.1993.394458"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1976.1084179"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/22.238513"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2006.869719"},{"key":"ref8","first-page":"1520","article-title":"On the unconditional stability of N-port networks","author":"colangeli","year":"2014","journal-title":"Proc 44th Eur Microw Conf (EuMC)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/22.179894"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1962.1086854"},{"journal-title":"Network Analysis and Feedback Amplifier Design","year":"1945","author":"bode","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2011.2170578"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/EuMIC.2016.7777538"},{"journal-title":"AMCAD Engineering","year":"2018","key":"ref22"},{"key":"ref21","first-page":"477","article-title":"Automatic pole-zero identification for multivariable large-signal stability analysis of RF and microwave circuits","author":"anakabe","year":"2010","journal-title":"Proc Eur Microw Conf (EuMC)"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2598168"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2521650"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8274985\/08424809.pdf?arnumber=8424809","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:16:27Z","timestamp":1642004187000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8424809\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/access.2018.2862162","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2018]]}}}