{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:18:10Z","timestamp":1740169090341,"version":"3.37.3"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61503398","51605483"],"award-info":[{"award-number":["61503398","51605483"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2018]]},"DOI":"10.1109\/access.2018.2877959","type":"journal-article","created":{"date-parts":[[2018,10,25]],"date-time":"2018-10-25T21:29:08Z","timestamp":1540502948000},"page":"65065-65077","source":"Crossref","is-referenced-by-count":2,"title":["Optimization of a Dynamic Fault Diagnosis Model Based on Machine Learning"],"prefix":"10.1109","volume":"6","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7958-8692","authenticated-orcid":false,"given":"Shigang","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xu","family":"Luo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yongmin","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Long","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaofei","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Handbook of Biological Statistics","year":"2009","author":"mcdonald","key":"ref39"},{"journal-title":"Fundamentals of Application Mathematical Statistics","year":"2013","author":"zhuang","key":"ref38"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/s10479-012-1171-9"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijar.2016.07.003"},{"journal-title":"Who learns better Bayesian network structures Constraint-Based score-based or hybrid algorithms?","year":"2018","author":"scutari","key":"ref31"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2017.01.029"},{"journal-title":"Learning Bayesian Networks","year":"2004","author":"neapolitan","key":"ref37"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/s41060-017-0085-7"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijar.2017.05.006"},{"key":"ref34","first-page":"2265","article-title":"Learning continuous-time Bayesian networks in relational domains: A non-parametric approach","author":"yang","year":"2016","journal-title":"Proc AAAI Conf Artif Intell"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/COASE.2009.5234134"},{"journal-title":"Testability Engineering and Maintenance System (TEAMS) Tool","year":"2018","key":"ref40"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2012.2210405"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2010.5446826"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2012.2208101"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2013.2244209"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2003.1234157"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2011.6058741"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2011.5747579"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MAES.2013.6470443"},{"key":"ref19","first-page":"31","article-title":"Research on intelligent diagnosis system with machine learning","volume":"44","author":"chen","year":"2008","journal-title":"Comput Eng Appl"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s10994-006-6889-7"},{"key":"ref4","first-page":"483","article-title":"Graphical models for diagnosis knowledge representation and inference","author":"luo","year":"2005","journal-title":"Proc IEEE Autotestcon"},{"key":"ref27","first-page":"1","article-title":"Learning Bayesian networks with ancestral constraints","author":"chen","year":"2016","journal-title":"Proc 30th Conf Neural Inf Process Syst (NIPS)"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/PCT.2007.4538452"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/5326.897073"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijar.2018.08.002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MILCOM.2008.4753131"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2008.2007986"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2007.352868"},{"key":"ref2","first-page":"6","author":"koller","year":"2009","journal-title":"Probabilistic Graphical Models Principles and Techniques"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2009.2025572"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2017.2697210"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2003.1234161"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.csda.2016.03.003"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/cjce.23249"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijar.2016.07.002"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-00374-6_5"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2636828"},{"key":"ref25","first-page":"1","article-title":"Learning treewidth-bounded Bayesian networks with thousands of variables","author":"scanagatta","year":"2016","journal-title":"Proc 30th Conf Neural Inf Process Syst (NIPS)"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8274985\/08509575.pdf?arnumber=8509575","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T15:09:07Z","timestamp":1643296147000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8509575\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/access.2018.2877959","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2018]]}}}