{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T22:02:15Z","timestamp":1766268135399,"version":"3.37.3"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61371161"],"award-info":[{"award-number":["61371161"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2018]]},"DOI":"10.1109\/access.2018.2878583","type":"journal-article","created":{"date-parts":[[2018,10,29]],"date-time":"2018-10-29T18:54:07Z","timestamp":1540839247000},"page":"65783-65795","source":"Crossref","is-referenced-by-count":9,"title":["Image Reconstruction Performance of a 12-Electrode CCERT Sensor Under Five Different Excitation Patterns"],"prefix":"10.1109","volume":"6","author":[{"given":"Zhen","family":"Xu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1677-4671","authenticated-orcid":false,"given":"Yandan","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0045-0576","authenticated-orcid":false,"given":"Baoliang","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1858-5994","authenticated-orcid":false,"given":"Zhiyao","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haifeng","family":"Ji","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haiqing","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1108\/SR-01-2016-0027"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/201"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/25\/1\/021"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2713834"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/IST.2017.8261442"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2017.12.017"},{"key":"ref37","doi-asserted-by":"crossref","first-page":"1132","DOI":"10.1109\/20.877640","article-title":"reconstruction techniques for electrical resistance tomography","volume":"36","author":"tamburrino","year":"2000","journal-title":"IEEE Transactions on Magnetics"},{"key":"ref36","first-page":"193","article-title":"Numerical modelling and analysis of the forward and inverse problems in electrical capacitance tomography","volume":"1","author":"soleimani","year":"2005","journal-title":"Int J Inf Syst Sci"},{"key":"ref35","first-page":"302","article-title":"Numerical solution of initial boundary value problems involving Maxwell’s equations in isotropic media","volume":"ap 14","author":"yee","year":"1966","journal-title":"IEEE Trans Antennas Propag"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/IEMBS.1990.691007"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2016.05.005"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2014.08.005"},{"key":"ref11","first-page":"292","article-title":"A comparative study of 3D electrical capacitance tomography","volume":"3","author":"soleimani","year":"2007","journal-title":"Int J Inf Syst Sci"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/26\/6\/065401"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2015.0329"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2015.0328"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2015.0445"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2005.02.010"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2013.05.026"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.seppur.2018.04.039"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2816946"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2012.10.002"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1117\/1.1377308"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/19\/9\/094008"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(03)00126-6"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/8\/5\/016"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2246912"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/7\/3\/005"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908315"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/13\/12\/301"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.powtec.2014.01.050"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/27\/11\/114008"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2014.12.103"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/el:19940540"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/32\/7\/S01"},{"key":"ref21","article-title":"Improving spatial and temporal resolution of electrical impedance tomogram (EIT) by partial imaging with limited measurements (PILM)","author":"wang","year":"2015","journal-title":"Proc 7th Int Symp Process Tomogr"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2410310"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/10.212056"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1049\/ip-smt:19981644"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.4999359"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8274985\/08514008.pdf?arnumber=8514008","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T02:25:50Z","timestamp":1643250350000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8514008\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/access.2018.2878583","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2018]]}}}