{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:18:08Z","timestamp":1740169088468,"version":"3.37.3"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61775163"],"award-info":[{"award-number":["61775163"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Instrumentation Program","award":["2013YQ030915"],"award-info":[{"award-number":["2013YQ030915"]}]},{"name":"Young Elite Scientists Sponsorship Program by CAST","award":["2017QNRC001"],"award-info":[{"award-number":["2017QNRC001"]}]},{"DOI":"10.13039\/501100010954","name":"Qingdao National Laboratory for Marine Science and\u00a0Technology","doi-asserted-by":"publisher","award":["QNLM201717"],"award-info":[{"award-number":["QNLM201717"]}],"id":[{"id":"10.13039\/501100010954","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2016M601260"],"award-info":[{"award-number":["2016M601260"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012166","name":"National Basic Research Program of China","doi-asserted-by":"crossref","award":["2010CB327802"],"award-info":[{"award-number":["2010CB327802"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2019]]},"DOI":"10.1109\/access.2019.2903325","type":"journal-article","created":{"date-parts":[[2019,3,6]],"date-time":"2019-03-06T15:55:42Z","timestamp":1551887742000},"page":"31494-31500","source":"Crossref","is-referenced-by-count":1,"title":["Optimal Measurement Matrix of Partial Polarimeter for Measuring Ellipsometric Parameters With Eight Intensity Measurements"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9944-3642","authenticated-orcid":false,"given":"Xiaobo","family":"Li","sequence":"first","affiliation":[]},{"given":"Haofeng","family":"Hu","sequence":"additional","affiliation":[]},{"given":"Hui","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Tiegen","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/JLT.2012.2196977"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/ACCESS.2015.2479247"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/JLT.2011.2163924"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1364\/OE.25.018872"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1007\/978-3-642-33956-1_2"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1364\/OE.20.021331"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1117\/12.2014578"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/j.jqsrt.2011.02.017"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1364\/AO.51.005302"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1364\/OE.24.029691"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.apsusc.2015.10.167"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1364\/AO.51.006805"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1088\/2040-8978\/18\/5\/055701"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/j.optcom.2018.02.068"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"2361","DOI":"10.1109\/JLT.2013.2265716","article-title":"Polarization scanning ellipsometry method for measuring effective ellipsometric parameters of isotropic and anisotropic thin films","volume":"31","author":"lo","year":"2013","journal-title":"J Lightw Technol"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1088\/0741-3335\/41\/2\/001"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1088\/0741-3335\/53\/3\/035001"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1007\/3-540-27488-X"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1063\/1.3502039"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1201\/9780203911587"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1117\/1.1467361"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1137\/1.9781611970791"},{"year":"2002","author":"papoulis","journal-title":"Probability random variables and stochastic processes","key":"ref21"},{"year":"2012","author":"elijah","journal-title":"Optimization Algorithms and Consistent Approximations","key":"ref24"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1364\/AO.33.004184"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1021\/j100065a011"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1364\/AO.49.000683"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8600701\/08661500.pdf?arnumber=8661500","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:54:10Z","timestamp":1641988450000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8661500\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2903325","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2019]]}}}