{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T16:38:31Z","timestamp":1774456711298,"version":"3.50.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"funder":[{"name":"National Hi-Tech Project, China","award":["61320605"],"award-info":[{"award-number":["61320605"]}]},{"name":"Collaborative Innovation Center of Novel Software Technology and Industrialization"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2019]]},"DOI":"10.1109\/access.2019.2905842","type":"journal-article","created":{"date-parts":[[2019,3,18]],"date-time":"2019-03-18T18:26:11Z","timestamp":1552933571000},"page":"40210-40219","source":"Crossref","is-referenced-by-count":25,"title":["Identify Silent Data Corruption Vulnerable Instructions Using SVM"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4142-8321","authenticated-orcid":false,"given":"Na","family":"Yang","sequence":"first","affiliation":[]},{"given":"Yun","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IPDPS.2016.111"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICSESS.2015.7339043"},{"key":"ref12","first-page":"1","article-title":"Understanding soft error propagation using efficient vulnerability-driven fault injection","author":"xu","year":"2012","journal-title":"Proc 42nd Annu IEEE\/IFIP Int Conf Dependable Syst Netw (DSN)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798243"},{"key":"ref14","first-page":"1534","article-title":"Characterization of stack behavior under soft errors","author":"ma","year":"2017","journal-title":"Proc IEEE Int Conf Design Autom Test Eur Conf Exhib"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5416-6"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-015-5513-9"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/SRDS.2016.016"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CLUSTER.2015.32"},{"key":"ref19","first-page":"175","article-title":"Automated diagnostic system for breast cancer using least square support vector machine","volume":"3","author":"hamid","year":"2017","journal-title":"American Journal of Biomedical Engineering"},{"key":"ref4","first-page":"156","article-title":"LADR: Low-cost application-level detector for reducing silent output corruptions","author":"chao","year":"2018","journal-title":"Proc Int Symp High-Perform Parallel Distrib Comput"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPDS.2017.2735971"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2016.24"},{"key":"ref5","first-page":"319","article-title":"Harnessing soft computations for low-budget fault tolerance","author":"daya","year":"2014","journal-title":"Proc IEEE\/ACM Int Symp Microarchitecture"},{"key":"ref8","first-page":"483","article-title":"Understanding scale-dependent soft-error behavior of scientific applications","author":"gokcen","year":"2018","journal-title":"Proc IEEE\/ACM Int Symp Cluster Cloud Grid Comput"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2656106.2656127"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2444855"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/8213638"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2014.6853212"},{"key":"ref20","first-page":"183","article-title":"Trading fault tolerance for performance in an encoding","author":"norman","year":"2017","journal-title":"Proc of Conf on Computing Frontiers"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8600701\/08668772.pdf?arnumber=8668772","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T01:57:20Z","timestamp":1643248640000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8668772\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2905842","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019]]}}}