{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,26]],"date-time":"2025-09-26T13:11:09Z","timestamp":1758892269693,"version":"3.37.3"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61774028","61771097"],"award-info":[{"award-number":["61774028","61771097"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Fundamental Research Funds for the China Central Universities","award":["ZYGX2016Z007"],"award-info":[{"award-number":["ZYGX2016Z007"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2019]]},"DOI":"10.1109\/access.2019.2907524","type":"journal-article","created":{"date-parts":[[2019,3,27]],"date-time":"2019-03-27T21:46:28Z","timestamp":1553723188000},"page":"43076-43083","source":"Crossref","is-referenced-by-count":5,"title":["Implementation of a Low Noise Amplifier With Self-Recovery Capability"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7314-111X","authenticated-orcid":false,"given":"Yanchen","family":"Liu","sequence":"first","affiliation":[]},{"given":"Caizhi","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Tupei","family":"Chen","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9730-3854","authenticated-orcid":false,"given":"Deyu","family":"Kong","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6751-7272","authenticated-orcid":false,"given":"Rui","family":"Guo","sequence":"additional","affiliation":[]},{"given":"J. J.","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Yuancong","family":"Wu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2273-5449","authenticated-orcid":false,"given":"S. G.","family":"Hu","sequence":"additional","affiliation":[]},{"given":"L. M.","family":"Rong","sequence":"additional","affiliation":[]},{"given":"Qi","family":"Yu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0615-7036","authenticated-orcid":false,"given":"Yang","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853502"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CAS-ICTD.2009.4960893"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2004.827014"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465501"},{"key":"ref14","first-page":"-565i","article-title":"Fully-integrated DECT\/Bluetooth multi-band LNA in \n$0.18~\\mu$\n\/m CMOS","volume":"1","author":"vidojkovic","year":"2004","journal-title":"Proc IEEE Int Symp Circuits Syst"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2046258"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/mop.29890"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/mop.29544"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2833875"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1985.1052307"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251229"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCAPT.2005.848581"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.843831"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2009.5290434"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2003.816656"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.859570"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2011.5770697"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2004.824365"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2008.915629"},{"key":"ref1","first-page":"1322","article-title":"Emerging yield and reliability challenges in nanometer CMOS technologies","author":"gielen","year":"2008","journal-title":"Proc Design Autom Test Eur"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1985.21952"},{"key":"ref22","first-page":"176","article-title":"Reliability challenges for 45 nm and beyond","author":"mcpherson","year":"2006","journal-title":"Proc 43rd ACM\/IEEE Design Autom Conf"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.876041"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910130"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/16.841242"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.07.100"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2017.2737320"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8600701\/08675277.pdf?arnumber=8675277","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,8,10]],"date-time":"2021-08-10T19:40:35Z","timestamp":1628624435000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8675277\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2907524","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2019]]}}}