{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,31]],"date-time":"2025-10-31T07:50:10Z","timestamp":1761897010356,"version":"3.37.3"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Basic Research Program of China","doi-asserted-by":"publisher","award":["2016QY07X1404"],"award-info":[{"award-number":["2016QY07X1404"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61602035"],"award-info":[{"award-number":["61602035"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2019]]},"DOI":"10.1109\/access.2019.2907977","type":"journal-article","created":{"date-parts":[[2019,3,28]],"date-time":"2019-03-28T18:52:25Z","timestamp":1553799145000},"page":"44276-44292","source":"Crossref","is-referenced-by-count":13,"title":["E-WBM: An Effort-Based Vulnerability Discovery Model"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9897-0579","authenticated-orcid":false,"given":"Xiajing","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rui","family":"Ma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Binbin","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Donghai","family":"Tian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xuefei","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Internet live stats","year":"2017","key":"ref39"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/1082983.1083273"},{"key":"ref33","first-page":"617","article-title":"Modeling learningless vulnerability discovery using a folded distribution","volume":"11","author":"younis","year":"2011","journal-title":"Proc Int’l Conf Secur Manage"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1567"},{"journal-title":"NVD Metabase","year":"2017","key":"ref31"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2380"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/1041685.1029930"},{"key":"ref36","first-page":"230","article-title":"A logarithmic poisson execution time model for software reliability measurement","author":"musa","year":"1984","journal-title":"Proc 7th Int Conf Softw Eng"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2006.1677355"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2014.2354037"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/24.994903"},{"journal-title":"StatCounter Global Stats","year":"2017","key":"ref40"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.asej.2015.05.009"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s40840-015-0170-9"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"7495","DOI":"10.1080\/03610926.2016.1154155","article-title":"Estimation of reliability in multicomponent stress–strength based on two parameter exponentiated Weibull Distribution","volume":"46","author":"rao","year":"2017","journal-title":"Commun Statist -Theory Methods"},{"key":"ref14","first-page":"2367","article-title":"Multi-Cycle vulnerability discovery model for prediction","volume":"21","author":"chen","year":"2010","journal-title":"J Softw"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s41096-016-0006-4"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/HASE.2007.55"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-48875-2_11"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.33889\/IJMEMS.2017.2.4-022"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/62.318876"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.11.030"},{"article-title":"A modeling method of software security vulnerability discovery model based on testing effort","year":"2017","author":"hu","key":"ref4"},{"article-title":"A multivariate Bayesian approach to modeling vulnerability discovery in the software security lifecycle","year":"2018","author":"johnston","key":"ref27"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2008.32"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2005.30"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.03.024"},{"key":"ref5","first-page":"127","article-title":"Security in open versus closed systems—The dance of Boltzmann, coase and Moore","author":"anderson","year":"2002","journal-title":"Economics of Open Source Software"},{"key":"ref8","first-page":"96","article-title":"The Weibull function: A new method of comparing seed vigor","volume":"1","author":"bonner","year":"1976","journal-title":"Journal of Seed Technology"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2005.17"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2010.10.007"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/24.210278"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2005.1408432"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-79789-7_31"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.1997.630857"},{"journal-title":"Vulnerabilities in major operating systems","year":"2004","author":"alhazmi","key":"ref21"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3724\/SP.J.1001.2013.04257"},{"journal-title":"W3Schools","year":"2019","key":"ref41"},{"key":"ref23","first-page":"149","article-title":"A software reliability growth model considering an S-shaped testing effort function under imperfect debugging","volume":"37","author":"li","year":"2011","journal-title":"J Harbin Eng Univ"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s41872-017-0003-y"},{"key":"ref25","first-page":"544","article-title":"Estimation model for software testing effort based on value","volume":"29","author":"wan","year":"2008","journal-title":"Eng Comput"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8600701\/08676014.pdf?arnumber=8676014","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,8,10]],"date-time":"2021-08-10T19:40:41Z","timestamp":1628624441000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8676014\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2907977","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2019]]}}}