{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,30]],"date-time":"2026-07-30T14:20:36Z","timestamp":1785421236163,"version":"3.56.0"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2019]]},"DOI":"10.1109\/access.2019.2917036","type":"journal-article","created":{"date-parts":[[2019,5,15]],"date-time":"2019-05-15T20:13:08Z","timestamp":1557951188000},"page":"63578-63587","source":"Crossref","is-referenced-by-count":16,"title":["Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2766-9188","authenticated-orcid":false,"given":"Andrea","family":"Floridia","sequence":"first","affiliation":[{"name":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Turin, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ernesto","family":"Sanchez","sequence":"additional","affiliation":[{"name":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Turin, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Matteo","family":"Sonza Reorda","sequence":"additional","affiliation":[{"name":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Turin, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2538800"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2016.2643663"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.124398"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675602"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/43.913755"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/43.85734"},{"key":"ref16","year":"2018","journal-title":"OR1200 Instruction Set Architecture"},{"key":"ref17","year":"2018","journal-title":"OR1200 Design"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/43.7799"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2018.8349679"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.68"},{"key":"ref4","year":"2018","journal-title":"Software Test Library Renesas"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/12.795222"},{"key":"ref3","year":"2018","journal-title":"Software Test Library Cypress"},{"key":"ref6","year":"2018","journal-title":"Software Test Library ARM"},{"key":"ref5","year":"2018","journal-title":"Software Test Library Microchip"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"88","DOI":"10.1109\/TCAD.2004.839486","article-title":"Effective software-based self-test strategies for on-line periodic testing of embedded processors","volume":"24","author":"paschalis","year":"2005","journal-title":"IEEE Trans Comput Aided Design Integr Circuits Syst"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"ref2","year":"2018","journal-title":"Software Test Library STMicroelectronics"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2498546"},{"key":"ref1","year":"2019","journal-title":"Software Test Library Infineon"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2018.8357281"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2683508"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763092"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2017.8244443"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203886"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LASCAS.2019.8667573"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2017.2758641"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8600701\/08715776.pdf?arnumber=8715776","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T17:28:54Z","timestamp":1729618134000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8715776\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2917036","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019]]}}}