{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T09:28:50Z","timestamp":1761989330102,"version":"3.37.3"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"funder":[{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"crossref","award":["2017XKZD03"],"award-info":[{"award-number":["2017XKZD03"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2019]]},"DOI":"10.1109\/access.2019.2918558","type":"journal-article","created":{"date-parts":[[2019,5,29]],"date-time":"2019-05-29T15:46:16Z","timestamp":1559144776000},"page":"69058-69069","source":"Crossref","is-referenced-by-count":9,"title":["An Approach for Detecting Infeasible Paths Based on a SMT Solver"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0643-0565","authenticated-orcid":false,"given":"Shujuan","family":"Jiang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hongyang","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6533-519X","authenticated-orcid":false,"given":"Yanmei","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Meng","family":"Xue","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Junyan","family":"Qian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Miao","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1145\/2338965.2336788"},{"key":"ref11","volume":"7635","author":"junker","year":"2012","journal-title":"SMT-Based False Positive Elimination in Static Program Analysis"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.infsof.2014.01.001"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1016\/j.ipl.2014.01.009"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1145\/2568225.2568242"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1016\/j.infsof.2007.06.006"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/C-M.1978.218136"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"279","DOI":"10.1109\/TSE.1977.231145","article-title":"testing programs with the aid of a compiler","volume":"se 3","author":"hamlet","year":"1977","journal-title":"IEEE Transactions on Software Engineering"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1016\/j.infsof.2016.05.001"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1002\/(SICI)1099-1689(199709)7:3<165::AID-STVR143>3.0.CO;2-U"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1145\/174675.175935"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1145\/24039.24041"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1049\/iet-sen.2009.0092"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1007\/978-3-642-31424-7_62"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/ICST.2010.13"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1145\/1146909.1147002"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/RTCSA.2014.6910500"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1007\/978-3-642-45422-6_5"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1007\/978-3-642-31424-7_61"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/CMPASS.1996.507890"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"2222","DOI":"10.1016\/j.jss.2011.06.028","article-title":"Evolutionary generation of test data for many paths coverage based on grouping","volume":"84","author":"zhang","year":"2011","journal-title":"J Syst Softw"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/32.92910"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1007\/s10515-014-0173-z"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1016\/j.infsof.2016.09.003"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8600701\/08725494.pdf?arnumber=8725494","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:54:45Z","timestamp":1641988485000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8725494\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2918558","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2019]]}}}