{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T09:28:58Z","timestamp":1762507738219,"version":"3.37.3"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2019]]},"DOI":"10.1109\/access.2019.2919384","type":"journal-article","created":{"date-parts":[[2019,5,27]],"date-time":"2019-05-27T19:17:03Z","timestamp":1558984623000},"page":"72505-72517","source":"Crossref","is-referenced-by-count":9,"title":["Fast S-Parameter TAN Model of n-Port Lumped Structures"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2307-1333","authenticated-orcid":false,"given":"C.","family":"Cholachue","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7334-5016","authenticated-orcid":false,"given":"B.","family":"Ravelo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Simoens","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Fathallah","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1109\/TMTT.2007.909141"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1109\/ACCESS.2018.2873042"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1109\/TEMC.2016.2610519"},{"key":"ref30","first-page":"439","article-title":"A formalism to compute the electromagnetic compatibility of complex networks","volume":"2","author":"maurice","year":"2011","journal-title":"Adv Appl Sci Res"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1109\/TEMC.2018.2814629"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1002\/j.1538-7305.1934.tb00679.x"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/15.3297"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/15.78351"},{"year":"2015","key":"ref13"},{"key":"ref14","first-page":"42","article-title":"Shielded cable transfer impedance measurements high frequency range 100 MHz-1 GHz","author":"d\u00e9moulin","year":"2011","journal-title":"Proc IEEE-EMC Newslett"},{"year":"2019","journal-title":"HFSS—3D Electromagnetic Simulation Software","key":"ref15"},{"year":"2019","journal-title":"CST—Computer Simulation Technology 3D electromagnetic simulation software","key":"ref16"},{"year":"2019","journal-title":"ADS—RF\/Microwave Electronic Circuit Simulation Software","key":"ref17"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/TEMC.2011.2146257"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/TMTT.1965.1125964"},{"year":"2008","author":"maurice","article-title":"Link between the free field and the elements of frontiers in a complex structure","key":"ref28"},{"key":"ref4","first-page":"168","article-title":"Simulation and experimental study on plug and pull characteristic of electrical connector contact","volume":"24","author":"luo","year":"2017","journal-title":"Chinese Journal of Engineering"},{"year":"2017","author":"maurice","article-title":"Elements of theory for electromagnetic compatibility and systems","key":"ref27"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1243\/09544070JAUTO799"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.2528\/PIERB15121806"},{"key":"ref29","first-page":"183","article-title":"Kron’s method and cell complexes for magnetomotive and electromotive forces","volume":"44","author":"maurice","year":"2014","journal-title":"Int J Appl Math"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/15.659522"},{"key":"ref8","first-page":"241","article-title":"Analysis of shielding effectiveness of HV cable and connector systems used for electric vehicles","author":"mushtaq","year":"2013","journal-title":"Proc Int Symp Electromagn Compat (EMC Europe)"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.2528\/PIERB12040205"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/HOLM.2002.1040838"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/15.249390"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/ISEMC.1992.626103"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"1589","DOI":"10.1109\/22.788598","article-title":"Unified equivalent-circuit model of planar discontinuities suitable for field theory-based CAD and optimization of M(H)MIC’s","volume":"47","author":"zhu","year":"1999","journal-title":"IEEE Trans Microw Theory Techn"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/22.869009"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1002\/jnm.431"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1016\/j.sna.2016.01.051"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.7227\/ijeee.0005"},{"year":"1939","author":"kron","journal-title":"Tensor Analysis of Networks","key":"ref26"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/TMTT.2016.2638846"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8600701\/08723344.pdf?arnumber=8723344","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T09:20:43Z","timestamp":1643275243000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8723344\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2919384","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2019]]}}}