{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,6]],"date-time":"2025-12-06T16:44:42Z","timestamp":1765039482400,"version":"3.37.3"},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100007928","name":"Ningbo Municipal Bureau of Science and Technology","doi-asserted-by":"publisher","award":["2018A-08-C","2013A31012","2014A35007"],"award-info":[{"award-number":["2018A-08-C","2013A31012","2014A35007"]}],"id":[{"id":"10.13039\/501100007928","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2019]]},"DOI":"10.1109\/access.2019.2929062","type":"journal-article","created":{"date-parts":[[2019,7,16]],"date-time":"2019-07-16T16:25:54Z","timestamp":1563294354000},"page":"96540-96548","source":"Crossref","is-referenced-by-count":18,"title":["Internal Current Return Path for Ground Leakage Current Mitigation in Current Source Inverters"],"prefix":"10.1109","volume":"7","author":[{"given":"Emilio","family":"Lorenzani","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9585-7837","authenticated-orcid":false,"given":"Giovanni","family":"Migliazza","sequence":"additional","affiliation":[]},{"given":"Fabio","family":"Immovilli","sequence":"additional","affiliation":[]},{"given":"Chris","family":"Gerada","sequence":"additional","affiliation":[]},{"given":"He","family":"Zhang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0470-3259","authenticated-orcid":false,"given":"Giampaolo","family":"Buticchi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2018.8558381"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2018.8558381"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2192284"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2003.810855"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2622722"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2096827"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2227820"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2017.7981035"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2190300"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/en12101922"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.924160"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/0471773719"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2674595"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8600701\/08764348.pdf?arnumber=8764348","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:32:55Z","timestamp":1641987175000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8764348\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2929062","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2019]]}}}