{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,19]],"date-time":"2025-10-19T16:04:50Z","timestamp":1760889890646,"version":"3.37.3"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61571306"],"award-info":[{"award-number":["61571306"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shenzhen Fundamental Research fund","award":["JCYJ20160331185006518","JCYJ20180306174120445"],"award-info":[{"award-number":["JCYJ20160331185006518","JCYJ20180306174120445"]}]},{"DOI":"10.13039\/501100009019","name":"Shenzhen University","doi-asserted-by":"publisher","award":["2019041"],"award-info":[{"award-number":["2019041"]}],"id":[{"id":"10.13039\/501100009019","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2019]]},"DOI":"10.1109\/access.2019.2931194","type":"journal-article","created":{"date-parts":[[2019,7,26]],"date-time":"2019-07-26T15:53:14Z","timestamp":1564156394000},"page":"105721-105733","source":"Crossref","is-referenced-by-count":14,"title":["Vison-Based 3D Shape Measurement System for Transparent Microdefect Characterization"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6162-2127","authenticated-orcid":false,"given":"Yuanlong","family":"Deng","sequence":"first","affiliation":[]},{"given":"Xizhou","family":"Pan","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5433-3631","authenticated-orcid":false,"given":"Xingzheng","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Xiaopin","family":"Zhong","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1088\/0034-4885\/59\/3\/003"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2806370"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2012.03.002"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1364\/AOP.3.000128"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-012-0990-6"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2011.06.004"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2019.01.004"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.06.012"},{"key":"ref35","first-page":"203","article-title":"Support vector regression","volume":"11","author":"basak","year":"2007","journal-title":"Neural Inf Process Lett Rev"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s00138-010-0281-0"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2193859"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3390\/s18082657"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2016.10.030"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.03.013"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.displa.2010.12.006"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2017.09.017"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2008.01.015"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-71629-7_60"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2013.03.001"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2011.05.014"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2011.02.010"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.polymertesting.2017.11.019"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"1123","DOI":"10.1007\/s00170-013-4904-2","article-title":"An industrial vision system for surface quality inspection of transparent parts","volume":"68","author":"mart\u00ednez","year":"2013","journal-title":"Int J Adv Manuf Technol"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.polymertesting.2017.05.029"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2007.02.005"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-014-0924-5"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijheatmasstransfer.2006.04.014"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2014.10.006"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2908483"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2911358"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2005.851648"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2016.2631658"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(02)00152-X"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/24\/4\/045401"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2008.03.013"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2011.02.133"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.11.015"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.03.017"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2842028"},{"key":"ref42","article-title":"3D granulometry using image processing","author":"ruggero","year":"0","journal-title":"IEEE Trans Ind Informat"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2018.02.017"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2017.11.008"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2016.01.011"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2923405"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.polymertesting.2016.05.011"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-012-0545-4"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2009.03.008"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8600701\/08777162.pdf?arnumber=8777162","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:33:00Z","timestamp":1641987180000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8777162\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":47,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2931194","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2019]]}}}