{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,7]],"date-time":"2026-03-07T19:01:43Z","timestamp":1772910103558,"version":"3.50.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["EEC-1041877"],"award-info":[{"award-number":["EEC-1041877"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2019]]},"DOI":"10.1109\/access.2019.2932035","type":"journal-article","created":{"date-parts":[[2019,7,30]],"date-time":"2019-07-30T20:03:53Z","timestamp":1564517033000},"page":"105054-105061","source":"Crossref","is-referenced-by-count":24,"title":["Impact of Low Data Quality on Disturbance Triangulation Application Using High-Density PMU Measurements"],"prefix":"10.1109","volume":"7","author":[{"given":"Xianda","family":"Deng","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1599-7961","authenticated-orcid":false,"given":"Desong","family":"Bian","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1469-7887","authenticated-orcid":false,"given":"Di","family":"Shi","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5011-2196","authenticated-orcid":false,"given":"Wenxuan","family":"Yao","sequence":"additional","affiliation":[]},{"given":"Ling","family":"Wu","sequence":"additional","affiliation":[]},{"given":"Yilu","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","article-title":"A robust low-frequency oscillation detection and analysis (LFODA) system with innovative ensemble filtering for real-time grid operation","author":"bian","year":"0","journal-title":"CSEE J Power Energy Syst"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/NAPS.2016.7747928"},{"key":"ref31","first-page":"1","article-title":"Frequency observations and statistic analysis of worldwide main power grids using FNET\/GridEye","author":"deng","year":"2019","journal-title":"Proc IEEE-PES Gen Meeting"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2574946"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2580002"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMI.2013.6743040"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/PESGM.2014.6939500"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-com.2018.5408"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2279182"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/PESW.2001.917238"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0142-0615(03)00045-0"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2005.857386"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2007.386018"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2011.2165566"},{"key":"ref17","first-page":"1","article-title":"Line outage detection and localization via synchrophasor measurement","author":"deng","year":"2019","journal-title":"Proc ISGT ASIA"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2014.2314116"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/SECON.2011.5752908"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2012.2207468"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/NAPS.2012.6336377"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2711558"},{"key":"ref3","first-page":"1","article-title":"Real-time co-simulation platform using OPAL-RT and OPNET for analyzing smart grid performance","author":"bian","year":"2015","journal-title":"Proc IEEE Power Energy Soc Gen Meeting"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2886225"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2018.2816027"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2016.2565058"},{"key":"ref8","first-page":"21","article-title":"CIM lead-in based on Java reflection mechanism in AEMS of Shanghai power grid","volume":"31","author":"deng","year":"2007","journal-title":"Autom Electr Power Syst"},{"key":"ref7","article-title":"Securing wide area measurement systems","author":"hadley","year":"2007"},{"key":"ref2","article-title":"Exploring six-phase transmission lines for increasing power transfer with limited right of way","author":"deng","year":"2012"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISGT.2011.5759155"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2017.2717806"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2011.2106521"},{"key":"ref22","first-page":"1","article-title":"Study on power system disturbance identification and location based on WAMS","author":"qin","year":"2012","journal-title":"Proc IEEE Power Energy Soc Gen Meeting"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISGTEurope.2012.6465867"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2014.2383693"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IREP.2013.6629374"},{"key":"ref26","first-page":"1","article-title":"Initial investigation of data mining applications in event classification and location identification using simulated data from minni-WECC","author":"yin","year":"2016","journal-title":"Proc North Amer Power Symp (NAPS)"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2559444"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielaam\/6287639\/8600701\/8781854-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8600701\/08781854.pdf?arnumber=8781854","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:53:50Z","timestamp":1649444030000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8781854\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2932035","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019]]}}}