{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T22:37:35Z","timestamp":1772836655281,"version":"3.50.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61370201"],"award-info":[{"award-number":["61370201"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100008081","name":"Southeast University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100008081","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2019]]},"DOI":"10.1109\/access.2019.2940872","type":"journal-article","created":{"date-parts":[[2019,9,11]],"date-time":"2019-09-11T15:51:31Z","timestamp":1568217091000},"page":"132374-132383","source":"Crossref","is-referenced-by-count":17,"title":["Reliability and Connectivity Analysis of Vehicular Ad Hoc Networks Under Various Protocols Using a Simple Heuristic Approach"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5817-014X","authenticated-orcid":false,"given":"Hussain","family":"Saajid","sequence":"first","affiliation":[]},{"given":"Wu","family":"Di","sequence":"additional","affiliation":[]},{"given":"Xin","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Sheeba","family":"Memon","sequence":"additional","affiliation":[]},{"given":"Naadiya Khuda","family":"Bux","sequence":"additional","affiliation":[]},{"given":"Yazan","family":"Aljeroudi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/VTCSpring.2015.7145647"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2007.897656"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.adhoc.2016.11.017"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/GLOCOM.2017.8254665"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2013.2251374"},{"key":"ref12","first-page":"115","article-title":"On the reliability of safety applications in VANETs","volume":"8","author":"ma","year":"2012","journal-title":"Int J Performability Eng"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2013.2244625"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCNC.2014.6785368"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.01.003"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.11.007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s11277-017-4980-y"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2012.2209690"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISACC.2015.7377363"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/598946"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11235-015-9979-7"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2898477"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-13-0396-8_3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s11276-015-1189-4"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.phycom.2019.100709"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.comcom.2018.01.006"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IACC.2017.0087"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.04.004"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jnca.2013.02.036"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.08.001"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.adhoc.2014.09.007"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2014.2319107"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICRITO.2015.7359297"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2016.2569585"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/data4010028"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2018.2789432"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2018.2865500"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2013.2274274"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8600701\/08832157.pdf?arnumber=8832157","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:31:02Z","timestamp":1641987062000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8832157\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2940872","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019]]}}}