{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T06:58:22Z","timestamp":1760597902276,"version":"3.37.3"},"reference-count":50,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61703410","61773386","61922089","61573366","61573076","61873273","61873175"],"award-info":[{"award-number":["61703410","61773386","61922089","61573366","61573076","61873273","61873175"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100007128","name":"Natural Science Foundation of Shaanxi Province","doi-asserted-by":"publisher","award":["2017JQ6015"],"award-info":[{"award-number":["2017JQ6015"]}],"id":[{"id":"10.13039\/501100007128","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004826","name":"Natural Science Foundation of Beijing Municipality","doi-asserted-by":"publisher","award":["KZ201710028028"],"award-info":[{"award-number":["KZ201710028028"]}],"id":[{"id":"10.13039\/501100004826","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2019.2948263","type":"journal-article","created":{"date-parts":[[2019,10,18]],"date-time":"2019-10-18T16:00:07Z","timestamp":1571414407000},"page":"11964-11978","source":"Crossref","is-referenced-by-count":12,"title":["Remaining Useful Life Prediction With Fusing Failure Time Data and Field Degradation Data With Random Effects"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2480-4188","authenticated-orcid":false,"given":"Shengjin","family":"Tang","sequence":"first","affiliation":[]},{"given":"Xiaodong","family":"Xu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5525-1104","authenticated-orcid":false,"given":"Chuanqiang","family":"Yu","sequence":"additional","affiliation":[]},{"given":"Xiaoyan","family":"Sun","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3532-9741","authenticated-orcid":false,"given":"Hongdong","family":"Fan","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5226-9923","authenticated-orcid":false,"given":"Xiao-Sheng","family":"Si","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.3390\/en7020520"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2924148"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.2011659"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2012.10.030"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2012.08.016"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1609"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2911307"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2403433"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2393840"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.09.013"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2299155"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.21629\/JSEE.2018.05.20"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2684821"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2774261"},{"journal-title":"Prognostics and Health Management of Electronics Fundamentals Machine Learning and the Internet of Things","year":"2008","author":"pecht","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2419220"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2513044"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2299151"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/03610918.2014.894057"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2013.11.011"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2017.2666199"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1080\/00949655.2012.719026"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2012.12.011"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11771-014-2455-9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/07408170590929018"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2008.05.027"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1080\/07408170802369409"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.928245"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2006.876609"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/asmb.2063"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/en12091685"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2923095"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2829844"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2182221"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2018.09.065"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2011.03.101"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2010.11.018"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/er.3598"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/07408170701730818"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2009.2016429"},{"journal-title":"Statistical Methods for Reliability Data","year":"1998","author":"meeker","key":"ref49"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2018.02.033"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/SDPC.2017.63"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/QRS-C.2017.35"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2026784"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.cja.2017.11.001"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/s11771-018-3747-2"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2012.09.015"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/PHM-Chongqing.2018.00119"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/PHM-Chongqing.2018.00043"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/08876626.pdf?arnumber=8876626","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:35:41Z","timestamp":1641987341000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8876626\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":50,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2948263","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2020]]}}}