{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,21]],"date-time":"2026-05-21T17:23:50Z","timestamp":1779384230261,"version":"3.53.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100004312","name":"Shenhua Group","doi-asserted-by":"publisher","award":["CSIE16024877"],"award-info":[{"award-number":["CSIE16024877"]}],"id":[{"id":"10.13039\/501100004312","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2019.2963500","type":"journal-article","created":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T21:00:37Z","timestamp":1577912437000},"page":"10134-10146","source":"Crossref","is-referenced-by-count":64,"title":["A DC Series Arc Fault Detection Method Using Line Current and Supply Voltage"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1685-2019","authenticated-orcid":false,"given":"Qiwei","family":"Lu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5192-3986","authenticated-orcid":false,"given":"Zeyu","family":"Ye","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6591-9382","authenticated-orcid":false,"given":"Mengmeng","family":"Su","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7108-1421","authenticated-orcid":false,"given":"Yasong","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9646-1351","authenticated-orcid":false,"given":"Yuce","family":"Sun","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1586-957X","authenticated-orcid":false,"given":"Hanqing","family":"Huang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref30","year":"2012"},{"key":"ref10","year":"2017"},{"key":"ref11","year":"2018"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2018.8557493"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2017.2653817"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2018.2864605"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2015.2450359"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2489759"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2273292"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2592186"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/INTLEC.2009.5352037"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2015.7104771"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PECON.2016.7951644"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2012.2201757"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2015.7310605"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TDC.2008.4517256"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2015.2389858"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICDCM.2015.7152068"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISGT.2015.7131851"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2008.4758283"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2327077"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/INAES.2016.7821945"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2533347"},{"key":"ref20","article-title":"Method and apparatus for detection and control of DC arc faults","author":"dargatz","year":"2012"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.5370\/JEET.2015.10.3.766"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2017.2707438"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2633335"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/PVSC.2016.7750271"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2057497"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2909267"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/08948040.pdf?arnumber=8948040","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:50:36Z","timestamp":1639770636000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8948040\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/access.2019.2963500","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}