{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,7]],"date-time":"2026-05-07T16:20:53Z","timestamp":1778170853181,"version":"3.51.4"},"reference-count":58,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100004663","name":"Ministry of Science and Technology, Taiwan","doi-asserted-by":"publisher","award":["MOST 108-2221-E-033-008"],"award-info":[{"award-number":["MOST 108-2221-E-033-008"]}],"id":[{"id":"10.13039\/501100004663","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.2974535","type":"journal-article","created":{"date-parts":[[2020,2,17]],"date-time":"2020-02-17T20:24:27Z","timestamp":1581971067000},"page":"49395-49411","source":"Crossref","is-referenced-by-count":12,"title":["A Data-Driven Approach for Identifying Possible Manufacturing Processes and Production Parameters That Cause Product Defects: A Thin-Film Filter Company Case Study"],"prefix":"10.1109","volume":"8","author":[{"given":"Jrjung","family":"Lyu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chia Wen","family":"Liang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2091-3555","authenticated-orcid":false,"given":"Ping-Shun","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2018.04.024"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2016.11.005"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2010.10.020"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3233\/IFS-152034"},{"key":"ref31","first-page":"3871","article-title":"The application of crisp and fuzzy decision trees to monitor insurance customer database","volume":"15","author":"lien","year":"2012","journal-title":"Int J Inf Inst"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1177\/0954406213492273"},{"key":"ref37","first-page":"1","author":"chapman","year":"2013","journal-title":"CRISP-DM 1 0 step-by-step data mining guide 2000"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-014-1263-3"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1080\/03155986.2016.1262584"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1108\/IMDS-09-2016-0409"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1613\/jair.279"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/BF00116251"},{"key":"ref29","first-page":"45","article-title":"CMIN—A CRISP-DM-based case tool for supporting data mining projects","volume":"30","author":"cobos","year":"2010","journal-title":"Ingeniería e Investigación"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3233\/AIS-170432"},{"key":"ref1","first-page":"447","article-title":"Measuring dynamic operation efficiency for universal top 10 TFT-LCDs by improved data envelopment analysis","volume":"77","author":"lee","year":"2018","journal-title":"J Sci Ind Res India"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2006.04.014"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2013.2291838"},{"key":"ref21","first-page":"318","article-title":"Analyzing TFT-LCD array big data for yield enhancement and an empirical study of TFT-LCD manufacturing in Taiwan","volume":"23","author":"chu","year":"2016","journal-title":"Int J Ind Eng -Theory"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpdc.2014.08.003"},{"key":"ref23","first-page":"37","article-title":"From data mining to knowledge discovery in databases","volume":"17","author":"fayyad","year":"1996","journal-title":"AI Mag"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1023\/A:1007608224229"},{"key":"ref25","author":"berry","year":"2004","journal-title":"Data Mining Techniques For Marketing Sales and Customer Support"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2011.2171375"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2014.12.008"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2012.01.133"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1016\/j.dss.2012.06.009"},{"key":"ref56","author":"crewson","year":"2006","journal-title":"Handbook in Applied Statistics"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1145\/170035.170072"},{"key":"ref54","author":"schewhart","year":"1931","journal-title":"Economic Control of Quality of Manufactured Product"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2015.03.014"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2010.2048968"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2018.03.018"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2017.09.003"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2016.09.023"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2765544"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s11036-017-0874-1"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.im.2016.05.007"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2016.07.013"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2017.01.028"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2016.05.009"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-013-0791-5"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s10696-012-9161-4"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2018.03.028"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2014.02.007"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"197","DOI":"10.1016\/j.future.2019.04.008","article-title":"SWITCH workbench: A novel approach for the development and deployment of time-critical microservice-based cloud-native applications","volume":"99","author":"\u0161tefani?","year":"2019","journal-title":"Future Gener Comput Syst"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2018.1449978"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2822332.2822339"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2894111"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2017.2753251"},{"key":"ref9","author":"manyika","year":"2012","journal-title":"Manufacturing the future The next era of global growth and innovation"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/66.983448"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1080\/21681015.2013.869512"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2015.1109153"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2016.2594288"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2009.2025812"},{"key":"ref41","first-page":"193","article-title":"Construct fuzzy decision tree for mining interrelated semiconductor manufacturing data for yield enhancement","volume":"15","author":"chien","year":"2008","journal-title":"J Quality"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2003.818959"},{"key":"ref43","first-page":"270","article-title":"Data mining for yield improvements","author":"kittler","year":"2000","journal-title":"Proc Modeling Anal Semiconductor Manuf Conf"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09000922.pdf?arnumber=9000922","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T01:08:18Z","timestamp":1641949698000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9000922\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":58,"URL":"https:\/\/doi.org\/10.1109\/access.2020.2974535","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}