{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,21]],"date-time":"2026-04-21T04:16:22Z","timestamp":1776744982410,"version":"3.51.2"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Key Research and Development Plan of Shaanxi Province of China","award":["2019ZDLGY03-01"],"award-info":[{"award-number":["2019ZDLGY03-01"]}]},{"name":"Key Research and Development Plan of Shaanxi Province of China","award":["2018ZDCXL-GL-05-03-02"],"award-info":[{"award-number":["2018ZDCXL-GL-05-03-02"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.2974798","type":"journal-article","created":{"date-parts":[[2020,2,18]],"date-time":"2020-02-18T21:33:43Z","timestamp":1582061623000},"page":"38448-38458","source":"Crossref","is-referenced-by-count":106,"title":["Detection and Evaluation Method of Transmission Line Defects Based on Deep Learning"],"prefix":"10.1109","volume":"8","author":[{"given":"Huagang","family":"Liang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6257-5622","authenticated-orcid":false,"given":"Chao","family":"Zuo","sequence":"additional","affiliation":[]},{"given":"Wangmin","family":"Wei","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2757030"},{"key":"ref11","first-page":"60","article-title":"Research on part recognition and defect detection of transmission line in deep learning","volume":"41","author":"tang","year":"2018","journal-title":"Electron Meas Technol"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2891123"},{"key":"ref14","first-page":"740","article-title":"SSD: Single shot MultiBox detector","author":"liu","year":"2014","journal-title":"Proc Eur Conf Comput Vis"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICAMechS.2019.8861617"},{"key":"ref16","article-title":"Yolov3: An incremental improvement","author":"redmon","year":"2018","journal-title":"arXiv 1804 02767"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206848"},{"key":"ref19","first-page":"818","article-title":"Visualizing and understanding convolutional networks","author":"zeiler","year":"2014","journal-title":"Vision Computer"},{"key":"ref4","article-title":"Method and means for recognizing complex patterns","author":"hough","year":"1962"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/GCIS.2010.74"},{"key":"ref6","article-title":"Research on insulator recognition methods in aerial image based on machine learning","author":"wu","year":"2016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISCID.2016.1045"},{"key":"ref8","first-page":"66","article-title":"Recognition method of insulator based on object proposals and structure research","volume":"43","author":"zhai","year":"2016","journal-title":"J North China Electr Power Univ (Natural Sci Ed )"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1006\/jcss.1997.1504"},{"key":"ref2","first-page":"1399","article-title":"Similar circular object recognition method based on local contour feature in natural scenario","volume":"36","author":"ban","year":"2016","journal-title":"J Comput Appl"},{"key":"ref1","first-page":"162","article-title":"Object recognition method based on local contour feature in natural scenario","volume":"52","author":"zhu","year":"2016","journal-title":"Comput Eng Appl"},{"key":"ref9","first-page":"1097","article-title":"ImageNet classification with deep convolutional neural networks","author":"krizhevsky","year":"2012","journal-title":"Proc Int Conf Neural Inf Process (ICONIP)"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2667405"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2647868.2654889"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09001041.pdf?arnumber=9001041","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:51:44Z","timestamp":1639770704000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9001041\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/access.2020.2974798","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}