{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,23]],"date-time":"2026-03-23T17:34:09Z","timestamp":1774287249795,"version":"3.50.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["21376091"],"award-info":[{"award-number":["21376091"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Guangdong Provincial Key Lab of Green Chemical Product Technology","award":["GC201812"],"award-info":[{"award-number":["GC201812"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.2977821","type":"journal-article","created":{"date-parts":[[2020,3,2]],"date-time":"2020-03-02T20:52:20Z","timestamp":1583182340000},"page":"42285-42296","source":"Crossref","is-referenced-by-count":65,"title":["A Weakly Supervised Surface Defect Detection Based on Convolutional Neural Network"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5671-4510","authenticated-orcid":false,"given":"Liang","family":"Xu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shuai","family":"Lv","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong","family":"Deng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiuxi","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-018-1415-x"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2807797"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2775345"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2017.04.053"},{"key":"ref36","first-page":"234","article-title":"U-Net: Convolutional networks for biomedical image segmentation","author":"ronneberger","year":"2015","journal-title":"Medical Image Computing and Computer-Assisted Intervention—MICCAI"},{"key":"ref35","article-title":"Encoder-decoder with atrous separable convolution for semantic image segmentation","author":"chen","year":"2018","journal-title":"arXiv 1802 02611"},{"key":"ref34","year":"2018","journal-title":"VISIONPRO VIDI Deep Learning-Based Software for Industrial Image Analysis"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-019-01476-x"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.06.020"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"76","DOI":"10.1016\/j.ifacol.2018.09.412","article-title":"Real-time detection of steel strip surface defects based on improved YOLO detection network","volume":"51","author":"li","year":"2018","journal-title":"IFAC-PapersOnLine"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2018.00150"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2019.107057"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2006.885448"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2015.2482222"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.02.048"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"436","DOI":"10.1038\/nature14539","article-title":"Deep learning","volume":"521","author":"lecun","year":"2015","journal-title":"Nature"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206848"},{"key":"ref28","article-title":"Densely connected convolutional networks","author":"huang","year":"2016","journal-title":"arXiv 1608 06993"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2012.6248110"},{"key":"ref27","article-title":"Deep residual learning for image recognition","author":"he","year":"2015","journal-title":"arXiv 1512 03385"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2912237"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2007.1038"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2012.6252468"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298780"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1520\/SSMS20180033"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2017.2668395"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2522191"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2017.2777499"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(02)00152-X"},{"key":"ref20","first-page":"558","article-title":"Detection of defects in color texture surfaces","author":"kittler","year":"1994","journal-title":"Proc IAPR Workshop on Mach Vision Appl (MVA)"},{"key":"ref22","first-page":"336","article-title":"Color and texture-based wood inspection with non-supervised clustering","author":"niskanen","year":"2001","journal-title":"Proc Scandinavian Conf Image Anal (SCIA)"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IPAS.2016.7880062"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.5565\/rev\/elcvia.268"},{"key":"ref23","first-page":"428","article-title":"Comparison of various filter sets for defect detection in textiles","volume":"1","author":"ade","year":"2014","journal-title":"Proc Int Conf Pattern Recognit (ICPR)"},{"key":"ref26","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"2014","journal-title":"arXiv 1409 1556"},{"key":"ref25","first-page":"1097","article-title":"ImageNet classification with deep convolutional neural networks","author":"krizhevsky","year":"2012","journal-title":"Proc 25th Int Conf Neural Inf Process Syst"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09020085.pdf?arnumber=9020085","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T19:30:26Z","timestamp":1643311826000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9020085\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/access.2020.2977821","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}