{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T18:27:35Z","timestamp":1772216855373,"version":"3.50.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51837007"],"award-info":[{"award-number":["51837007"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51907125"],"award-info":[{"award-number":["51907125"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.2981177","type":"journal-article","created":{"date-parts":[[2020,3,16]],"date-time":"2020-03-16T19:24:56Z","timestamp":1584386696000},"page":"55602-55618","source":"Crossref","is-referenced-by-count":46,"title":["Generalized MIMO Sequence Impedance Modeling and Stability Analysis of MMC-HVDC With Wind Farm Considering Frequency Couplings"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9939-0376","authenticated-orcid":false,"given":"Haoxiang","family":"Zong","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5667-0490","authenticated-orcid":false,"given":"Chen","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1817-7926","authenticated-orcid":false,"given":"Jing","family":"Lyu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9052-9423","authenticated-orcid":false,"given":"Xu","family":"Cai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marta","family":"Molinas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fangquan","family":"Rao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.23919\/ICEMS.2018.8549246"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2017.2762408"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2842682"},{"key":"ref13","article-title":"Impedance-based stability analysis of voltage-controlled MMCs feeding linear AC systems","author":"wu","year":"0","journal-title":"IEEE J Emerg Sel Topics Power Electron"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2018.5527"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2866639"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2019.105928"},{"key":"ref17","article-title":"Impedance-based analysis of interconnected power electronics systems: Impedance network modeling and comparative studies of stability criteria","author":"zhang","year":"0","journal-title":"IEEE J Emerg Sel Topics Power Electron"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2016.2558840"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/COMPEL.2016.7556695"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2295259"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2015.2472476"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2017.2766217"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2941129"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2017.1066"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2015.2498182"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2017.2759096"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CPE.2017.7915191"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2857832"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2017.2661540"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2003.1304403"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/59.867135"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2588733"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2398192"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2262473"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2684906"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2909576"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2017.2761791"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09037312.pdf?arnumber=9037312","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T20:17:34Z","timestamp":1643314654000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9037312\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/access.2020.2981177","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}