{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T01:39:10Z","timestamp":1772415550281,"version":"3.50.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Guangzhou Province Science and Technology Plan of China","award":["201802020008"],"award-info":[{"award-number":["201802020008"]}]},{"DOI":"10.13039\/501100004517","name":"Research Foundation of Tianjin University","doi-asserted-by":"publisher","award":["2019GKF-0134"],"award-info":[{"award-number":["2019GKF-0134"]}],"id":[{"id":"10.13039\/501100004517","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.2982288","type":"journal-article","created":{"date-parts":[[2020,3,20]],"date-time":"2020-03-20T19:55:33Z","timestamp":1584734133000},"page":"59934-59946","source":"Crossref","is-referenced-by-count":108,"title":["Insulator Defect Recognition Based on Global Detection and Local Segmentation"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7789-524X","authenticated-orcid":false,"given":"Xuefeng","family":"Li","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7872-6037","authenticated-orcid":false,"given":"Hansong","family":"Su","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2100-679X","authenticated-orcid":false,"given":"Gaohua","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cvi.2017.0591"},{"key":"ref33","first-page":"8024","article-title":"Pytorch: An imperative style, high-performance deep learning library","author":"paszke","year":"2019","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref32","first-page":"4278","article-title":"Inception-v4, Inception-resnet and the impact of residual connections on learning","author":"szegedy","year":"2017","journal-title":"Proc 31st AAAI Conf Artif Intell"},{"key":"ref31","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"2014","journal-title":"arXiv 1409 1556"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/3DV.2016.79"},{"key":"ref37","article-title":"Conditional generative adversarial nets","author":"mirza","year":"2014","journal-title":"arXiv 1411 1784"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.660"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.632"},{"key":"ref34","article-title":"Adam: A method for stochastic optimization","author":"kingma","year":"2014","journal-title":"arXiv 1412 6980"},{"key":"ref10","first-page":"21","article-title":"SSD: Single shot multibox detector","author":"liu","year":"2016","journal-title":"Proc Eur Conf Comput Vis"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JPETS.2018.2881429"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTCC.2019.8885695"},{"key":"ref13","article-title":"YOLOv3: An incremental improvement","author":"redmon","year":"2018","journal-title":"arXiv 1804 02767"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICASID.2019.8925094"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2871750"},{"key":"ref16","article-title":"An accurate and real-time self-blast glass insulator location method based on faster R-CNN and U-net with aerial images","author":"ling","year":"2018","journal-title":"arXiv 1801 05143"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICCWAMTIP.2017.8301453"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CISP-BMEI.2018.8633245"},{"key":"ref19","first-page":"234","article-title":"U-net: Convolutional networks for biomedical image segmentation","author":"ronneberger","year":"2015","journal-title":"Proc Int Conf Med Image Comput Comput -Assist Intervent"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206848"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2846293"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.89"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/ChiCC.2017.8029108"},{"key":"ref6","first-page":"91","article-title":"Faster-RCNN: Towards real-time object detection with region proposal networks","author":"ren","year":"2015","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref29","first-page":"421","article-title":"Concurrent spatial and channel ’squeeze & excitation’in fully convolutional networks","author":"roy","year":"2018","journal-title":"Proc Int Conf Med Image Comput Comput -Assist Intervent"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCA.2018.8444172"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref7","first-page":"262","article-title":"Study on power line insulator defect detection via improved faster region-based convolutional neural network","author":"liao","year":"2019","journal-title":"Proc IEEE 7th Int Conf Comput Sci Netw Technol (ICCSNT)"},{"key":"ref2","first-page":"892","article-title":"Insulator identification from aerial images using support vector machine with background suppression","author":"wang","year":"2016","journal-title":"Proc Int Conf Unmanned Aircraft Systems (ICUAS"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2891123"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/GCIS.2010.74"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298965"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2931144"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.322"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2915985"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.106"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.634"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09043526.pdf?arnumber=9043526","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T18:43:41Z","timestamp":1643309021000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9043526\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/access.2020.2982288","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}